Scott, J.
and Bright, D.
(2021),
Application of the Hough Transform to Electron Energy-Loss Spectrum-Line Acquisition, Journal of Microscopy-Oxford
(Accessed October 7, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Application of the Hough Transform to Electron Energy-Loss Spectrum-Line Acquisition
Published
Author(s)
J H. Scott,
Abstract
We present a procedure based on the linear Hough transform for visualizing and quantitatively measuring the tilt alignment of spectrum-line datasets. By combining the transform with a simple angular translation, information about the quality of the vertical alignment of the dataset on the detector can also be extracted. Together, this information can be applied to minimize artifacts that appear in the spectra that arise when the dispersion direction of the spectrometer is not parallel to the pixel pitch of the CCD detector.Citation
Journal of Microscopy-Oxford
Pub Type
Journals
Keywords
alignment, EELS, electron energy-loss, Hough transform, spectrum-line, TEM
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 12, 2021