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Displaying 51 - 75 of 2585

2023 OWM Annual Analysis

July 6, 2023
John McGuire, Lisa Warfield
The NIST OWM Analysis is submitted to assist the Weights and Measures community as it deliberates on items before the Conference. NIST OWM offers these comments and recommendations based upon information and input available as of the date of this report.

Operando photoelectron spectromicroscopy of nanodevices: Correlating the surface chemistry and transport in SnO2 nanowire chemiresistors

June 29, 2023
Andrei Kolmakov, Trey Diulus, Kurt D. Benkstein, Stephen Semancik, Majid Kazemian, Matteo Amati, Maya Kiskinova, Luca Gregoratti
With size reduction of active elements in microelectronics to tens of nanometers and below, the effect of surface and interface properties on overall device performance becomes crucial. High resolution spectroscopic and imaging techniques provide a

Laser tracker interim testing per the ASME B89.4.19-2021 and ISO 10360-10:2021 standards

June 28, 2023
Marcos Motta de Souza, Bala Muralikrishnan, Vincent Lee, Daniel S. Sawyer
The recently revised ASME B89.4.19-2021 and ISO 10360-10:2021 standards for laser trackers include a new interim test that is comprehensive and more sensitive to systematic errors than the interim tests in the previous versions of the standards, i.e., the

2022 NIST Summary of U.S. Legal Metrology Activities

June 20, 2023
Lisa Warfield, Tina G. Butcher, Richard A. Harshman, Jan Konijnenburg, Gloria Diane Lee, David Sefcik, Juana Williams, Katrice Lippa
The NIST Office of Weights and Measures (OWM) presents its first report 2022 NIST Annual Summary of U.S. Legal Metrology Activities report. This report includes a summary of changes made to NIST Handbook 44 (2021) Specifications, Tolerances and Other

Reference Isotherms for Water Vapor Sorption on Nanoporous Carbon: Results of an Interlaboratory Study

May 26, 2023
Huong Giang Nguyen, Blaza Toman, Roger D. van Zee, Carsten Prinz, Matthias Thommes, Riaz Ahmad, David Kiska, Jamie Salinger, Ian Walton, Krista Walton, Darren Broom, Mike Benham, Humera Ansari, Ronny Pini, Camille Petit, Jurgen Adolphs, Andreas Schreiber, Toshihiro Shigeoka, Yuko Konishi, Kazuyuki Nakai, Matthias Henninger, Thomas Petrzik, Can Kececi, Vladimir Martis, Thomas Pasche, Enzo Mangano, Stefano Brandani

The design and performance of an electronic torque standard directly traceable to the revised SI

May 25, 2023
Zane Comden, John-Edward Draganov, Stephan Schlamminger, Frank Seifert, Charles Waduwarage Perera, David B. Newell, Leon Chao
The United States National Institute of Standards and Technology (NIST) has been developing a new device for primary standard realization of torque utilizing established trace- ability to the quantum-electrical International System of Units (SI) standards

Nonlinear Networks for Arbitrary Optical Synthesis

May 19, 2023
Jennifer Black, Zachary Newman, Su-Peng Yu, David Carlson, Scott Papp
Nonlinear wavelength conversion is a powerful control of light, especially when implemented at the nanoscale with integrated photonics. However, strict energy conservation and phase-matching requirements constrain the converted output. To overcome these

Reflective deep-ultraviolet Fourier ptychographic microscopy for nanoscale imaging

April 29, 2023
Kwanseob Park, Yoon Sung Bae, Sang-Soo Choi, Martin Sohn
Fourier ptychographic microscopy (FPM) that has high space-bandwidth-product and phase imaging capability requires significant resolution enhancement in reflection mode for imaging of nanoscale semiconductor devices. A direct way to nanoscale resolution is

NeuroBench: advancing neuromorphic computing through collaborative, fair and representative benchmarking

April 20, 2023
Jason Yik, Soikat Hasan Ahmed, Zergham Ahmed, Brian Anderson, Andreas G. Andreou, Chiara Bartolozzi, Arindam Basu, Douwe den Blanken, Petrut Bogdan, Sonia Buckley, Sander Bohte, Younes Bouhadjar, Gert Cauwenberghs, Federico Corradi, Guido de Croon, Andreea Danielescu, Anurag Daram, Mike Davies, Yigit Demirag, Jason K. Eshraghian, Jeremy Forest, Steve Furber, Michael Furlong, Aditya Gilra, Giacomo Indiveri, Siddarth Joshi, Vedant Karia, Lyes Khacef, James C. Knight, Laura Kriener, Rajkumar Kubendran, Dhireesha Kudithipudi, Gregor Lenz, Rajit Manohar, Christian Mayr, Konstantinos Michmizos, Dylan Muir, Emre Neftci, Thomas Nowotny, Fabrizio Ottati, Ayca Ozcelikkale, Noah Pacik-Nelson, Priyadarshini Panda, Sun Pao-Sheng, Melika Payvand, Christian-Gernot Pehle, Mihai Alexandru Petrovici, Cristoph Posch, Alpha Renner, Yulia Sandamirskaya, Clemens Schaefer, Andre van Schaik, Johannes Schemmel, Catherine Schuman, Jae-sun Seo, Sumit Bam Shrestha, Manolis Sifalakis, Amos Sironi, Kenneth Stewart, Terrence Stewart, Philipp Stratmann, Guangzhi Tang, Jonathan Timcheck, Marian Verhelst, Craig Vineyard, Bernard Vogginger, Amirreza Yousefzadeh, Biyan Zhou, Fatima Tuz Zohora, Charlotte Frenkel, Vijay Janapa Reddy
The field of neuromorphic computing holds great promise in terms of advancing computing efficiency and capabilities by following brain-inspired principles. However, the rich diversity of techniques employed in neuromorphic research has resulted in a lack

ITS-90 SPRT Calibration from the Ar TP to the Zn FP

March 30, 2023
Michal J. Chojnacky, Tobias Herman, Ken Hill, Steffen Rudtsch, Inseok Yang, Petrus Paulus Maria Steur, Roberto Dematteis, Lopardo Lopardo, Fernando Sparasci, Catherine Martin, Lara Risegari, Januarius Widiatmo, Tohru Nakano, Ikuhiko Saito, Klaus Natorf Quelhas, Patricia Giorgio, Jianping Sun, Jintao Zhang, Jonathan Pearce, Jayne Gray
This is a report to the Consultative Committee for Thermometry (CCT) on the key comparison 9 of SPRT calibration on the International Temperature Scale of 1990 (ITS-90) from 83.8058 K (the Ar triple point) to 692.677 K (the Zn freeze point). The comparison

The Digital NIST: Challenges And Opportunities in the Digital Transformation of NIST's Reference Materials

March 30, 2023
William Dinis Camara, Steven J. Choquette, Katya Delak, Robert Hanisch, Benjamin Long, Melissa M. Phillips, Jared Ragland, Kate Rimmer
Early in 2022 NIST embarked on a pilot project to produce digital calibration reports and digital certificates of analysis for reference materials. The goal of the project is to produce a few examples of digital reports and certificates for the purpose of

New Method for Determining Time Constant of Resistors

March 21, 2023
Yicheng Wang, Dean G. Jarrett, Andrew D. Koffman, Stephan Schlamminger
We report a new method for determining the time constant of ac resistors with values around 10 kΩ, using a digital impedance bridge for comparison of two nominally equal resistors. The method involves adding a probing capacitor in parallel to one of the

Resolving Complex Photoconductivity of Perovskite and Organic Semiconductor Films Using Phase-Sensitive Microwave Interferometry

March 2, 2023
Jasleen Bindra, Pragya Shrestha, Sebastian Engmann, Chad Cruz, Lea Nienhaus, Emily Bittle, Jason Campbell
Complex transient photoconductivity (Δσ) contains rich fingerprints of charge recombination dynamics in photoactive films. However, a direct measure of both real (Δσ′) and imaginary (Δσ″) components has proven difficult using conventional cavity-based time

Preparation and Standardization of 229Th SRM 4328d

February 24, 2023
Ronald Colle, Lizbeth Laureano-Perez, Morgan DiGiorgio
The certified massic activity for 229Th in SRM 4328d was obtained by 4παβ liquid scintillation (LS) counting by comparative measurements in 2022 against SRM 4328c. Both SRMs were prepared from the identical 2007 229Th stock solution. SRM 4328c was

Checking the Net Contents of Packaged Goods

February 13, 2023
Tina G. Butcher, David Sefcik, Lisa Warfield, Elizabeth Benham, Shelby Bowers, Katrice Lippa
This handbook has been prepared as a procedural guide for the compliance testing of net content statements on packaged goods. Compliance testing of packaged goods is the determination of the conformance results of packaging, distribution, and sale of

Uniform Laws and Regulations in the Areas of Legal Metrology and Fuel Quality

February 13, 2023
Tina G. Butcher, David Sefcik, Lisa Warfield, Shelby Bowers, Katrice Lippa
NIST Handbook 130 includes a compilation of model laws and regulations and related interpretations and guidelines designed to encourage uniformity in adoption and implementation of weights and measures laws and regulations. The model laws and regulations

A Non-Intrusive Fluorescent Pattern for Internal Microscale Strain Measurements Using Digital Image Correlation

February 1, 2023
Ami Ahure Powell, William Mulhearn, Shawn Chen, Stephan J. Stranick, Jeffrey Gilman, Mark Iadicola, Jeremiah Woodcock
A non-intrusive and non-disruptive internal fluorescent pattern is designed, developed, and tested using digital image correlation (DIC), an effective non-contact optical method, to measure deformation at internal planes of a polymer matrix material. The

Specifications, Tolerances, and Other Technical Requirements for Weighing and Measuring Devices

January 30, 2023
Tina G. Butcher, Richard A. Harshman, Jan Konijnenburg, Gloria Diane Lee, Juana Williams, Lisa Warfield, Shelby Bowers, Katrice Lippa, Elizabeth Benham
NIST Handbook 44 includes specifications, tolerances, and other technical requirements for weighing and measuring devices. These requirements are intended to encourage the design, installation, testing, and use of weighing and measuring devices that

What does the pixel measure?

January 11, 2023
David W. Flater
The pixel is often used as a unit of measurement in information technology. Unfortunately, there is not a simple, consistently-applicable answer to what it is a measure of. This report analyzes the pixel unit through the lens of metrology and shows how one

Dealing with counts and other quantal quantities in quantity calculus

January 1, 2023
David W. Flater
Continuity is usually assumed as a defining feature of measured quantities. This premise is false for counted quantities, amount of substance, electric charge, and others that are constrained to exist in integral multiples of a quantum. A software

Isotope Dilution Mass Spectrometry as an Independent Assessment for Mass Measurements of Milligram Quantities of Aqueous Solution

January 1, 2023
Richard Essex, Jacqueline L. Mann, Denis E. Bergeron, Ryan P. Fitzgerald, Svetlana Nour, Gordon A. Shaw, R. Michael Verkouteren
Isotope dilution mass spectrometry was used to independently assess the accuracy of mass measurement methods developed to quantitatively dispense milligram quantities of aqueous solution. Solutions of isotopically enriched 158Gd and enriched 155Gd were
Displaying 51 - 75 of 2585