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Four-dimensional scanning transmission electron microscopy: I, Imaging, strain mapping and defect detection

Published

Author(s)

Aaron Johnston-Peck, Andrew Herzing
Citation
Electronic Device Failure Analysis Magazine

Citation

Johnston-Peck, A. and Herzing, A. (2023), Four-dimensional scanning transmission electron microscopy: I, Imaging, strain mapping and defect detection, Electronic Device Failure Analysis Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936621 (Accessed May 30, 2024)

Issues

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Created August 1, 2023, Updated September 14, 2023