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PUBLICATIONS

Four-dimensional scanning transmission electron microscopy: I, Imaging, strain mapping and defect detection

Published

Author(s)

Aaron Johnston-Peck, Andrew Herzing
Citation
Electronic Device Failure Analysis Magazine
Pub Type
Others

Download Paper

Local Download
Metrology and Materials characterization

Citation

Johnston-Peck, A. and Herzing, A. (2023), Four-dimensional scanning transmission electron microscopy: I, Imaging, strain mapping and defect detection, Electronic Device Failure Analysis Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936621 (Accessed October 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created August 1, 2023, Updated September 14, 2023
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