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Search Publications

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Displaying 26 - 50 of 1526

Design of an intelligent PYTHON code to run coupled and license-free finite-element and statistical analysis software for calibration of near-field scanning microwave microscopes

October 2, 2019
Author(s)
Jeffrey T. Fong, Nathanael A. Heckert, James J. Filliben, Pedro V. Marcal, Samuel Berweger, Thomas M. Wallis, Pavel Kabos
To calibrate near-field scanning microwave microscopes (NSMM) for defect detection and characterization in semiconductors, it is common to develop a parametric finite element analysis (FEA) code to guide the microscope user on how to optimize the settings

Comparison of Multiple Methods for Obtaining PO Resistances with Low Uncertainties

September 3, 2019
Author(s)
Kwang Min Yu, Dean G. Jarrett, Albert Rigosi, Shamith Payagala, Marlin E. Kraft
Capabilities for high resistance determinations are essential for calibration of currents below 1 pA, as typically requested in several applications, including semiconductor device characterization, single electron transport, and ion beam technologies

Detecting and Receiving Phase-Modulated Signals With a Rydberg Atom-Based Receiver

September 2, 2019
Author(s)
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon, David R. Novotny
Recently, we introduced a Rydberg-atom based mixer capable of detecting and measuring of the phase of a radio-frequency field through the electromagnetically induced transparency (EIT) and Autler-Townes (AT) effect. The ability to measure phase with this

Machine Learning in a Quality Managed RF Measurement Workflow

July 7, 2019
Author(s)
Aric W. Sanders, John Bass, Arpita Bhutani, Mary A. Ho, James C. Booth
Advances in artificial intelligence, or more specifically machine learning, have made it possible for computers to recognize patterns as well or better than humans. The process of quality management in radio-frequency measurements is an arduous one that

Electric Field Gradient Reference Material for Scanning Probe Microscopy

April 1, 2019
Author(s)
Joseph J. Kopanski, Lin You
Any eSPM measurement of a spatially varying electric field at the surface of a sample has a large uncertainty due to the unknown details of the tip shape near the surface. We have designed an electric field gradient reference sample to provide an

A Rydberg Atom-Based Mixer: Measuring the Phase of a Radio Frequency Wave

March 18, 2019
Author(s)
Christopher L. Holloway, Matthew T. Simons, Abdulaziz H. Haddab, Joshua A. Gordon
Rydberg atoms have been shown to be very useful in performing absolute measurements of the magnitude of a radio frequency (RF) field using electromagnetically-induced transparency (EIT). However, there has been less success in using Rydberg atoms for the

Dielectric-Loaded Microwave Rectangular Waveguide and Higher Order Modes Resonator

March 1, 2019
Author(s)
Christopher L. Holloway, Abdulaziz H. Haddab, Edward Kuester
Resonant transmission through a dielectric-loaded slot in a thick conducting diaphragm embedded in a rectangular waveguide is modeled using an analytical approximation based on the slot being small compared to a free space wavelength. Image theory relates

Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station

January 14, 2019
Author(s)
Duane J. McCrory, Mark Anders, Jason Ryan, Pragya Shrestha, Kin P. Cheung, Patrick M. Lenahan, Jason Campbell
We report on a novel electron paramagnetic resonance (EPR) technique that merges electrically detected magnetic resonance (EDMR) with a conventional semiconductor wafer probing station. This union, which we refer to as wafer-level EDMR (WL-EDMR), allows

Measurement of Ion-Pairing Interactions in Buffer Solutions with Microwave Microfluidics

January 1, 2019
Author(s)
Charles A. Little, Angela C. Stelson, Nathan D. Orloff, Christian J. Long, James C. Booth
Broadband microwave microfluidics is an emerging technique for quantifying the frequency dependent electrical response of fluids in the microwave regime. This technique can access important physical properties including interfacial polarization, ion

Millimeter-Wave Channel Measurement and Modeling: A NIST Perspective

December 7, 2018
Author(s)
Camillo A. Gentile, Peter B. Papazian, Nada T. Golmie, Catherine A. Remley, Peter G. Vouras, Jelena Senic, Jian Wang, Jack Chuang, Ruoyu Sun
The exponential increase in wireless data transmission from smartphones has led to the saturation of the sub-6-GHz bands, forcing cellular providers to migrate to the millimeter-wave (mmWave) regime for 5G. Although available channel bandwidths will grow

Determining Carbon Fiber Composite Loading by Flip-Chip on a Coplanar Waveguide to 110GHz

November 22, 2018
Author(s)
Nina P. Basta, Jasper A. Drisko, Aaron M. Hagerstrom, Joshua A. Orlicki, Jennifer M. Sietins, Daniel B. Knorr, Jr., Edward J. Garboczi, Christian J. Long, Nathan D. Orloff
The electrical properties of materials are a necessary part of any circuit design. As applications at millimeter-wave frequen-cies increase, there is a growing need to develop new materials with low loss and multiple functionalities. Unfortunately, many

Precision Optical Antenna Alignment System for Tracking Antennas in 6-DOF

November 4, 2018
Author(s)
Joshua A. Gordon, David R. Novotny, Michael S. Allman
We present on an all-optical spatial metrology system, the PiCMM, that aids in the alignment and tracking of antennas with accuracies on the order of 25 microns and 0.01 deg. This system speeds up millimeter-wave antenna alignment, does not require contact

Persistence of Electromagnetic Units in Magnetism

November 1, 2018
Author(s)
Ronald B. Goldfarb
The centimeter-gram-second system of electromagnetic units (EMU) has been used in magnetism since the late 19th century. The International System of Units (SI), a successor to Giorgi's 1901 meter- kilogram-second system, was adopted by the General

Using Radiation Pressure to Develop a Radio-Frequency Power Measurement Technique Traceable to the Redefined SI

October 15, 2018
Author(s)
Christopher L. Holloway, Matthew T. Simons, David R. Novotny, John H. Lehman, Paul A. Williams, Gordon A. Shaw
We discuss a power measurement technique traceable to the International System of Units based on radiation pressure (or radiation force) carried by an electromagnetic wave. A measurement of radiation pressure offers the possibility for a power measurement

Uncertainties in Rydberg Atom-based RF E-field Measurements

October 8, 2018
Author(s)
Matthew T. Simons, Marcus D. Kautz, Joshua A. Gordon, Christopher L. Holloway
A new atom-based electric (E) field measurement approach (using Rydberg atoms) is being investigated by several groups around the world as a means to develop a new SI-traceable RF E- field standard. For this technique to be useful it is important to

MEMS non-absorbing electromagnetic power sensor employing the effect of radiation pressure

September 9, 2018
Author(s)
Ivan Ryger, Alexandra B. Artusio-Glimpse, Paul A. Williams, Gordon A. Shaw, Matthew T. Simons, Christopher L. Holloway, John H. Lehman
We demonstrate a compact electromagnetic power sensor based on force effects of electromagnetic radiation onto a highly reflective mirror surface. Unlike the conventional power measurement approach, the photons are not absorbed and can be further used in

Determining Carbon Fiber Composite Loading with Flip-Chip Measurements to 110 GHz

September 1, 2018
Author(s)
Nina P. Basta, Aaron Hagerstrom, Jasper A. Drisko, James Booth, Edward Garboczi, Christian Long, Nathan Orloff
— Electrical properties of materials are a necessary part of any circuit design. With emerging applications at millimeter- wave frequencies, there is a need to characterize new materials before they come to market. At frequencies below about 67 GHz, it is

Development and Applications of a Fiber-Coupled Atom-Based Electric Field Probe

August 27, 2018
Author(s)
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon
We are developing a fundamentally new atom-based approach for electric (E) field measurements. This new approach will lead to a self-calibrated, SI traceable, E-field measurement, and has the capability to perform measurements on a fine spatial resolution

High-resolution near-field imaging and far-field antenna measurements with atomic sensors

August 27, 2018
Author(s)
Christopher L. Holloway, Matthew T. Simons, Dave Anderson, Georg Raithel
—Measurements of radio-frequency (RF) electric fields using atomic sensors based on quantum-optical spectroscopy of Rydberg states in vapors has garnered significant interest in recent years for the establishment of atomic standards for RF electric fields

Fiber-coupled Vapor Cell for a Portable Rydberg Atom-based RF Electric Field Sensor

August 1, 2018
Author(s)
Matthew T. Simons, Joshua A. Gordon, Christopher L. Holloway
We demonstrate a moveable Rydberg atom based radio frequency (RF) electric (E) field probe. The technique is based on electromagnetically-induced transparency (EIT) and Autler-Townes splitting. Two fibers attached to an 10mm cube Cs vapor cell are used to
Displaying 26 - 50 of 1526