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Displaying 24576 - 24600 of 73970

Hydrogen Spillover Effect of Pt-Doped Activated Carbon Studied by Inelastic Neutron Scattering

August 24, 2011
Author(s)
Cheng-Si Tsao, Yun Liu, Haw-Yeu Chuang, Huan-Hsiung Tseng, Tsan-Yao Chen, Chien-Hung Chen, Ming-Sheng Yu, Qixiu Li, Angela Lueking, Sow-Hsin Chen
We employed inelastic neutron scattering (INS) method to directly monitor the change of molecular hydrogen in the Pt-doped activated carbon (Pt/AC) samples and provide very conclusive evidence that significant hydrogen atoms can diffuse to the carbon

Selective Oxidation of Glycerol by Highly Active Bimetallic Catalysts at Ambient Temperature under Base Free Conditions

August 24, 2011
Author(s)
Andrew A. Herzing, Gemma L. Brett, Peter Miedziak, Nikolaos Dimitratos, Meenakshisundaram Sankar, Marco Conte, Jose A. Lopez-Sanchez, David W. Knight, Stuart H. Taylor, Graham J. Hutchings, Qian He, Christopher J. Kiely
AuPt or AuPd nanoparticles when supported on Mg(OH)2 are highly active for the selective oxidation of glycerol under base-free conditions at ambient temperatures. When bimetallic particles with the appropriate composition are prepared, catalysts with a

Nanometer Size Magnetic Domains and Coherent Magnetization Reversal in a Giant Exchange Bias System

August 23, 2011
Author(s)
C. Dufour, M .R. Fitzsimmons, Julie Borchers, M. Laver, Kathryn L. Krycka, K. Dumesnil, Shannon M. Watson, Wangchun Chen, S. Singh
We present compelling evidence obtained with small angle scattering of unpolarized and polarized neutron beams the magnetization reversal occurs via formation of 10-100's nm sized magnetic domains in an exchanged biased DyFe 2/YFed2^ superlattice. The

Note: Detection of a single cobalt microparticle with a microfabricated atomic magnetometer

August 23, 2011
Author(s)
Svenja A. Knappe, D. Maser, S. Pandey, H. Ring, Micah P. Ledbetter, John E. Kitching, Dimitry Budkerl
Detection of the magnetic signal of a single, 2 {um}m cobalt microparticle using an atomic magnetometer based on a microfabricated vapor cell is presented. These results represent an improvement by a factor of 10 in terms of the detected magnetic moment

Helical Magnetic Order in MnSi Thin Films

August 22, 2011
Author(s)
E. A. Karhu, S. Kahwaji, M. D. Robertson, H. Fritzche, Brian Kirby, Charles Majkrzak, T. L. Monchesky
We present a study of the magnetic structure of crystalline MnSi(111) thin films by molecular beam epitaxy. A combination of polarized neutron diffraction (PNR) and SQUID magnetometry show that the films have helical magnetic order with a pitch vector Q

The Residual Resistance Ratio of High-Purity Platinum

August 22, 2011
Author(s)
Weston L. Tew, William E. Murdock, Michal J. Chojnacky, Dean C. Ripple
High-purity platinum wire is produced for use in both Standard Platinum Resistance Thermometers (SPRTs) and type S and type R thermocouples. The resistance ratio W(T90) and thermoelectric characteristics of the wire are a function of chemical purity and

Trust-Based Multi-Agent Filtering for Increased Smart Grid Security

August 22, 2011
Author(s)
Ion Matei, John S. Baras, Vijay Srinivasan
We address the problem of state estimation of the power system for the Smart Grid.We assume that the monitoring of the electrical grid is done by a network of agents with both computing and communication capabilities. We propose a security mechanism aimed

Alternative Cooling Technology Options

August 21, 2011
Author(s)
J S. Brown, Piotr A. Domanski
This paper considers the alternative cooling technologies studied by Fisher et al. (1994) and assesses their current potential to compete with or to replace vapor compression refrigeration technology for space cooling and near-room temperature

A Prototype IEEE 1451.4 Smart Transducer Interface for Sensors and Actuators

August 19, 2011
Author(s)
Yuyin Song, David M. Westbrook, Kang B. Lee
Analog transducers (sensors or actuators) are widely used in industry. The Institute of Electrical and Electronics Engineers (IEEE) 1451.4 standard defines a mixed-mode communication protocol and the Transducer Electronic Data Sheet (TEDS) formats for

Catalyst-free GaN nanowire growth and optoelectronic characterization

August 19, 2011
Author(s)
Kristine A. Bertness, Norman A. Sanford, John B. Schlager
We discuss the present state-of-the-art concerning the growth mechanism, optical luminescence and electrical properties for GaN nanowires grown with catalyst-free molecular beam epitaxy. These nanowires are essentially defect-free and display long

Common Platform Enumeration: Applicability Language Specification Version 2.3

August 19, 2011
Author(s)
David A. Waltermire, Paul R. Cichonski, Karen Scarfone
This report defines the Common Platform Enumeration (CPE) Applicability Language version 2.3 specification. The CPE Applicability Language specification is part of a stack of CPE specifications that support a variety of use cases relating to IT product

Common Platform Enumeration: Dictionary Specification Version 2.3

August 19, 2011
Author(s)
Paul R. Cichonski, David A. Waltermire, Karen Scarfone
This report defines the Common Platform Enumeration (CPE) Dictionary version 2.3 specification. The CPE Dictionary Specification is a part of a stack of CPE specifications that support a variety of use cases relating to IT product description and naming

Common Platform Enumeration: Name Matching Specification Version 2.3

August 19, 2011
Author(s)
Mary Parmelee, Harold Booth, David A. Waltermire, Karen Scarfone
This report defines the Common Platform Enumeration (CPE) Name Matching version 2.3 specification. The CPE Name Matching specification is part of a stack of CPE specifications that support a variety of use cases relating to IT product description and

Common Platform Enumeration: Naming Specification Version 2.3

August 19, 2011
Author(s)
Brant Cheikes, David A. Waltermire, Karen Scarfone
This report defines the Common Platform Enumeration (CPE) Naming version 2.3 specification. The CPE Naming specification is a part of a stack of CPE specifications that support a variety of use cases relating to IT product description and naming. The CPE

Accurate Nanometer-Scale Imaging and Measurements with SEM

August 18, 2011
Author(s)
Bradley N. Damazo, Bin Ming, Premsagar P. Kavuri, Andras Vladar, Michael T. Postek
Scanning electron microscopes (SEMs) are incredibly versatile instruments for millimeter to nanometer scale imaging and measurements of size and shape. New methods to improve repeatability and accuracy have been implemented on the so-called Reference SEMs
Displaying 24576 - 24600 of 73970
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