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Displaying 2326 - 2350 of 4226

Understanding Imaging and Metrology with the Helium Ion Microscope

March 1, 2009
Author(s)
Michael T. Postek, Andras Vladar, Bin Ming
The development of accurate metrology for the characterization of nanomaterials is one barrier to innovation confronting all phases of nanotechnology. Ultra-high resolution microscopy is a key technology needed to achieve this goal. But, current microscope

Manufacturing Interoperability Program, a Synopsis

February 24, 2009
Author(s)
Sharon J. Kemmerer
Started in 2005, the Manufacturing Interoperability Program has seen an investment of roughly 25-30 full-time staff who have researched, developed, and deployed standards, tools, techniques, and testing environments --- helping manufacturing enterprise

ASME B89.4.19 Performance Evaluation Tests and Geometric Misalignments in Laser Trackers

January 30, 2009
Author(s)
Balasubramanian Muralikrishnan, Daniel S. Sawyer, Christopher J. Blackburn, Steven D. Phillips, Bruce R. Borchardt, William T. Estler
Small and unintended offsets, tilts, and eccentricity of the mechanical and optical components in laser trackers introduce systematic errors in the measured spherical coordinates (angles and range readings), and possibly in the calculated lengths of

Dimensional measurement traceability of 3D imaging data

January 19, 2009
Author(s)
Steven D. Phillips, Craig M. Shakarji, Michael Krystek, K Summerhays
This paper discusses the concept of metrological traceability to the SI unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challenges to

Simulation-based Manufacturing Interoperability Standards and Testing

January 7, 2009
Author(s)
Guodong Shao, Swee K. Leong, Charles R. McLean
Software applications for manufacturing systems developed using software from different vendors typically cannot work together. Develop¬ment of custom integrations of manufacturing software incurs costs and delays that hurt industry productivity and

Advice from the CCL on the use of unstabilized lasers as standards of wavelength: the helium-neon laser at 633 nm

January 1, 2009
Author(s)
Jack A. Stone Jr., Jennifer Decker, Patrick Gill, Andrew Lewis, Patrick Juncar, Daniele Rovera, Miguel Villiseid
The Consultative Committee for Length has recommended that red (633 nm) unstabilized Helium-Neon lasers, operating on the 3s2¿_2p4 transition, should be included in the list of standard frequencies for realization of the meter. This article discusses

Scatterfield Optical Imaging for sub-10 nm Dimensional Metrology

January 1, 2009
Author(s)
Richard M. Silver
Recent developments in optical microscopy promise to advance optical metrology and imaging to unprecedented levels through theoretical and experimental development of a new measurement technique called "scatterfield optical imaging". ". Current metrology

NDRProfile Schema Version 1.0 User Guide

December 16, 2008
Author(s)
Joshua Lubell, Betty Harvey, Puja Goyal, Katherine C. Morris
The NDRProfile schema provides a common syntax for exchanging, managing, and reusing XML Schema naming and design rules (NDRs). NDRProfile, used by NIST's Quality of Design (QOD) application as a format for import and export of rule sets, is also useful

2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)

December 10, 2008
Author(s)
Ronald G. Dixson, Jon R. Pratt, Vincent A. Hackley, James E. Potzick, Richard A. Allen, Ndubuisi G. Orji, Michael T. Postek, Herbert S. Bennett, Theodore V. Vorburger, Jeffrey A. Fagan, Robert L. Watters
A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for National Measurement Standards (NRC-INMS) on February 7, 2007 when the first Tri-National workshop

Blind estimation of general tip shape in AFM imaging

December 1, 2008
Author(s)
Fenglei Tian, Xiaoping Qian, John S. Villarrubia
The use of flared tip and bi-directional servo control in some recent atomic force microscopes (AFM) has made it possible for these advanced AFMs to image structures of general shapes with undercuts and reentrant surfaces. Since AFM images are distorted

Development Life Cycle for Semantically Coherent Data Exchange Specification

December 1, 2008
Author(s)
Boonserm Kulvatunyou, Katherine C. Morris, Simon P. Frechette
In enterprise integration, a data-exchange specification is an architectural artifact that evolves along with the business. Maintaining a coherent, data-exchange, semantic model is an important, yet non-trivial task. A coherent, semantic model of data-

Computational Parameters in Simulation of Microscope Images

November 28, 2008
Author(s)
Egon Marx, James E. Potzick
The simulation of microscope images computed from scattered fields determined using integral equations depend on a number of parameters that are not related to the scatterer or to the microscope but are choices made for the computation method. The effect
Displaying 2326 - 2350 of 4226
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