U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 21926 - 21950 of 74045

The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)

March 27, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Craig D. McGray, Richard A. Allen, Muhammad Y. Afridi, Brian J. Nablo, Michael Gaitan, David G. Seiler
This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures from which material and dimensional properties are obtained using five documentary standard test

Analyzing Surfactant Structures on Length and Chirality Resolved (6,5) Single-Wall Carbon Nanotubes by Analytical Ultracentrifugation

March 26, 2013
Author(s)
Jeffrey A. Fagan, Ming Zheng, Jeffrey R. Simpson, Vinayak Rastogi, Constantine Y. Khripin, Carlos A. Silvera Batista, Angela R. Hight Walker
The structure and density of the bound interfacial surfactant layer and associated hydration shell were investigated using analytical ultracentrifugation for length and chirality purified (6,5) single-wall carbon nanotubes (SWCNTs) in three different bile

Camera Recognition

March 26, 2013
Author(s)
Michelle P. Steves, Brian C. Stanton, Mary F. Theofanos, Dana E. Chisnell, Hannah Wald
The Department of Homeland Security’s (DHS) United States Visitor and Immigrant Status Indicator Technology (US-VISIT) program is a biometrically-enhanced identification system primarily situated at border points of entry such as airports and seaports. In

Table-top ultrafast x-ray microcalorimeter spectrometry for molecular structure

March 26, 2013
Author(s)
Jens (. Uhlig, William B. Doriese, Joseph W. Fowler, Daniel S. Swetz, Carl D. Reintsema, Douglas A. Bennett, Leila R. Vale, Gene C. Hilton, Kent D. Irwin, Joel N. Ullom, Ilari Maasilta, Wilfred Fullagar, Niklas Gador, Sophie Canton, Kimmo Kinnunen, Villy Sundstrom
This work presents an x-ray absorption measurement by use of ionizing radiation generated by a femtosecond pulsed laser source. The spectrometer was a microcalorimetric array whose pixels are capable of accurately measuring energies of individual radiation

3-D Optical Metrology of Finite sub-20 nm Dense Arrays using Fourier Domain Normalization

March 25, 2013
Author(s)
Jing Qin, Hui Zhou, Bryan M. Barnes, Ronald G. Dixson, Richard M. Silver
Reduced target dimensions requiring improved resolution and sensitivity have driven the need to use and analyze the phase and scattered frequency information available when using image-based scatterometry systems. One such system is scatterfield microscopy

Charge-Based Capacitance Measurements Circuits for Interface With Atomic Force Microscope Probes

March 25, 2013
Author(s)
Joseph J. Kopanski, Muhammad Y. Afridi, Chong Jiang, Michael Lorek, Timothy Kohler, Curt A. Richter
The charge based capacitance measurement (CBCM) technique is highly sensitive to small capacitances and capable integration of onto an AFM tip, thereby reducing stray and wire capacitance to the bare minimum. The CBCM technique has previous been applied to

Spatially-Resolved Dopant Characterization with a Scanning Microwave Microscope

March 25, 2013
Author(s)
Thomas M. Wallis, Atif A. Imtiaz, Alexandra E. Curtin, Pavel Kabos, Matthew D. Brubaker, Norman A. Sanford, Kristine A. Bertness
The scanning microwave microscope (SMM) is a tool for spatially-resolved microwave characterization of nanoelectronic materials and devices. The microscope incorporates a sharp, near-field probe, which measures local changes in reflected microwave signals

ACTS: A Combinatorial Test Generation Tool

March 22, 2013
Author(s)
Raghu N. Kacker
In this paper, we introduce a combinatorial test generation tool called Advanced Combinatorial Testing System (or ACTS). ACTS supports t-way combinatorial test generation with several advanced features such as mixed-strength test generation and constraint

An Input Space Modeling Methodology for Combinatorial Testing

March 22, 2013
Author(s)
Mehra N. Borazjany, Laleh Ghandehari, Yu Lei, Raghu N. Kacker, D. Richard Kuhn
The input space of a system must be modeled before combinatorial testing can be applied to this system. The effectiveness of combinatorial testing to a large extent depends on the quality of the input space model. In this paper we introduce an input space

Applying Combinatorial Testing to the Siemens Suite

March 22, 2013
Author(s)
Laleh Ghandehari, Mehra N. Borazjany, Yu Lei, Raghu N. Kacker, D. Richard Kuhn
Combinatorial testing has attracted a lot of attention from both industry and academia. A number of reports suggest that combinatorial testing can be effective for practical applications. However, there still seems to lack systematic, controlled studies on

Combinatorial Coverage Measurement Concepts and Applications

March 22, 2013
Author(s)
David R. Kuhn, Itzel (. Dominquez Mendoza, Raghu N. Kacker, Yu Lei
Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of measures

Concept Analysis to Enrich Manufacturing Service Capability Models

March 22, 2013
Author(s)
Jun H. Shin, Boonserm Kulvatunyou, Yunsu Lee, Nenad Ivezic
When an Original Equipment Manufacturer (OEM), which makes a final product for the consumer marketplace by purchasing components from its suppliers, faces unexpected supply network failures and market events, models of suppliers’ manufacturing service

Requirements Analysis for Safer Ambulance Patient Compartments

March 22, 2013
Author(s)
Mehdi Dadfarnia, Yung-Tsun T. Lee, Allison Barnard Feeney, Deogratias Kibira
Providing emergency care services in the confined space of the patient compartment of a moving ambulance is a hazardous activity. A National Institute of Standards & Technology (NIST)/Department of Homeland Security (DHS) project is applying systems
Displaying 21926 - 21950 of 74045
Was this page helpful?