U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 21376 - 21400 of 74049

Calibration-Kit Design for Millimeter-Wave Silicon Integrated Circuits

July 1, 2013
Author(s)
Dylan F. Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Tai Wei, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
We study and present design guidelines for thru-reflect-line vector-network-analyzer calibration kits used for characterizing circuits and transistors fabricated on silicon integrated circuits at millimeter-wave frequencies. We compare contact-pad designs

Capturing Rare Cells From Blood Using a Packed Bed of Custom-Synthesized Chitosan Microparticles

July 1, 2013
Author(s)
Chandamany Arya, Jason Kralj, Kunqiang Jiang, Matt S. Munson, Thomas Forbes, Don L. DeVoe, Srinivasa R. Raghavan, Samuel Forry
Uniform multifunctional chitosan microparticles were produced in large numbers using a simple and inexpensive microtubing arrangement. The particles were functionalized through both physical encapsulation of carbon black, to attenuate autofluorescence, and

Conditions for two-photon interference with coherent pulses

July 1, 2013
Author(s)
Yong-Su Kim, Oliver T. Slattery, Paulina Kuo, Xiao Tang
We report experiments on two-photon interference between temporally non-overlapping weak coherent pulses. While the single-photon interference is washed out, the two-photon interference shows a Hong-Ou-Mandel dip with visibility of 0.50±0.09, which shows

July 2013 SRM Spotlight

July 1, 2013
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Office of Reference Materials for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

Parallel Geometric Classification of Stem Cells by Their 3D Morphology

July 1, 2013
Author(s)
Derek Juba, Antonio Cardone, Cheuk Y. Ip, Carl Simon Jr., Christopher K. Tison, Girish Kumar, Mary C. Brady
Autologous stem cells show great promise for tissue engineering as they can regenerate diseased or damaged tissue, without requiring an organ donor or causing immune rejection. A primary goal of regenerative medicine is to identify methods for controlling

Trace water vapor analysis in specialty gases: sensor and spectroscopic approaches

July 1, 2013
Author(s)
Kristine A. Bertness, Mark W. Raynor, Kevin C. Cossel, Florian B. Adler, Jun Ye
The analysis of water vapor impurity is important in a number of specialty gas applications. However the main driver for the development and advancement of trace H 2O analysis techniques has been the microelectronics industry. The International Technology

What's in a 'NYM?

July 1, 2013
Author(s)
Robert R. Keller
The field of electron microscopy, by its very diverse nature, abounds with acronyms: AEM, EF-TEM, ESEM, FE-SEM, HREM, HRTEM, HVEM, SEM, STEM, TEM, and VP-SEM, to name some instruments alone. Add in the different forms of data that these instruments might

3D Ground-Truth Systems for Object/Human Recognition and Tracking

June 28, 2013
Author(s)
Afzal A. Godil, Roger V. Bostelman, Kamel Saidi, William P. Shackleford, Geraldine Cheok, Michael O. Shneier, Tsai H. Hong
We have been researching 3D ground-truth systems for performance evaluation of vision and perception systems in the fields of smart manufacturing and robotics safety. In this paper we first present an overview of different systems that have been used to

99.996% 12C films enriched and deposited in situ

June 28, 2013
Author(s)
Kevin J. Dwyer, Joshua M. Pomeroy, David S. Simons
A mass selected ion beam system is used to isotopically enrich and deposit thin films, which are measured to be 99.9961(4)% 12C. In solid state quantum information, isotopic enrichment of materials has allowed significant improvements in the coherence time

Atomic-level stick-slip

June 28, 2013
Author(s)
Robert W. Carpick, Rachel J. Cannara, Ashlie Martini
Atomic level stick-slip refers to the behavior of a sliding interface, usually an atomic force microscope tip sliding along a crystalline surface, whereby the tip sticks and then slips laterally with respect to the surface in a periodic fashion. The

Demonstration of a dressed-state phase gate for trapped ions

June 28, 2013
Author(s)
Ting Rei Tan, John P. Gaebler, Ryan S. Bowler, Yiheng Lin, John D. Jost, Dietrich G. Leibfried, David J. Wineland
We demonstrate a trapped ion entangling gate scheme proposed by Bermudez et~al [Phys. Rev. A 85, 040302 (2012)]. Simultaneous excitation of a strong carrier and a single sideband transition enables deterministic creation of entangled states. The method
Displaying 21376 - 21400 of 74049
Was this page helpful?