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Search Publications

NIST Authors in Bold

Displaying 201 - 225 of 3118

Examining epitaxial graphene surface conductivity and quantum Hall device stability with Parylene passivation

March 20, 2018
Author(s)
Albert F. Rigosi, Chieh-I Liu, Bi Y. Wu, Hsin Y. Lee, Mattias Kruskopf, Yanfei Yang, Heather M. Hill, Jiuning Hu, Emily G. Bittle, Jan Obrzut, Angela R. Hight Walker, Randolph E. Elmquist, David B. Newell
When it comes to the advancement of quantized Hall resistance (QHR) standards, homogeneous, single-crystal, monolayer epitaxial graphene (EG) is the most promising candidate. EG-based quantum Hall devices, though emerging as a useful tool for metrology

Remote Bias Induced Electrostatic Force Microscopy for Subsurface Imaging

March 5, 2018
Author(s)
Joseph J. Kopanski, Lin You, Yaw S. Obeng
Contrast in electrostatic force microscopy (EFM) depends on the electrostatic force between the tip and sample. In the related technique, scanning Kelvin force microscopy (SKFM), contrast arises from the force due to the capacitance gradient with tip-to

Measurement of Radio-Frequency Radiation Pressure

February 13, 2018
Author(s)
Christopher L. Holloway, Alexandra B. Artusio-Glimpse, Matthew T. Simons, Ivan Ryger
In this work we perform measurements of the radiation pressure of a radio-frequency (RF) electromagnetic field which will lead to a new SI traceable power calibration. There are several groups around the world investigating methods to perform more direct

Identifying spurious modes in RF-MEMS resonators using photoelastic imaging

January 21, 2018
Author(s)
Vikrant J. Gokhale, Jason J. Gorman
This paper reports the first use of dynamic photoelastic imaging for identifying in-plane vibration modes in high-frequency MEMS resonators. In a set of width-extensional mode resonators (WE-BARs), we map fundamental width-extensional modes and unwanted

How to extract distributed circuit parameters from the scattering parameters of a transmission line

January 15, 2018
Author(s)
Nathan D. Orloff, Jasper A. Drisko, Angela C. Stelson, Charles A. Little, James C. Booth, Jordi Mateu, Christian J. Long
Distributed circuit parameters parameterize the transmission and reflection off a given transmission line in terms of a distributed resistance, inductance, capacitance, and conductance, which are per unit length frequency dependent quantities. While there

G-band Reflectivity Results of Conical Blackbody for Radiometer Calibration

January 14, 2018
Author(s)
Derek A. Houtz, Dazhen Gu
Two hollow conical cavities have been developed and built for the National Institute of Standards and Technology (NIST) for use as radiometric brightness temperature sources, or blackbodies. According to Kirchoff's reciprocity relation, a good absorber is

On the Susceptibility of Coded OFDM to Interference: A Simulation Study

January 3, 2018
Author(s)
Jason Coder, Yao Ma
The susceptibility of broadband wireless communications signals (e.g., LTE, IEEE 802.11) to interference has been a topic of significant research. In this paper, we implement a simulation-based study on the impact interference can have on the bit error

The Multi-Robot Large Antenna Positioning System for Over-The-Air Testing at the National Institute of Standards and Technology1

December 31, 2017
Author(s)
David R. Novotny, Josh Gordon, Michael S. Allman, Jeffrey R. Guerrieri, Alexandra Curtin, Kim Hassett, George McAdams, Quang Ton
To address dynamic testing requirements of new communications systems and RF processes that use non-static beam forming, NIST proposed the Large Antenna Positioning System (LAPS). The LAPS consists of two kinematically-linked six axis robotic arms, one of

Hybrid Characterization of Nanolitre Dielectric Fluids in a Single Microfluidic Channel up to 110 GHz Song

December 1, 2017
Author(s)
Nathan D. Orloff, Song Liu, James C. Booth, Dylan F. Williams, Dominec Schreurs, Bart Nauwelaers, Iija Oclet, Charles A. Little
In this work, we present a new “hybrid” method for dielectric measurements of nanolitre fluid samples on-wafer. The first part of the hybrid method is a technique which extracts the 4 complex permittivity of the microfluidic channel wall material. The

Characterization of Transmission Lines with Nonlinear Dielectric Materials

November 28, 2017
Author(s)
Aaron M. Hagerstrom, Christian J. Long, Nathan D. Orloff, James C. Booth, Eric J. Marksz
Nonlinear transmission lines are interesting for two broad reasons: first, they have several direct device applications (i.e. harmonic generation, and phase shifters), and second, they provide a way to characterize nonlinear materials at mm-wave

Establishing Traceability for SOLT Calibration Kits*

November 28, 2017
Author(s)
Ronald A. Ginley
Establishing traceability for a measurement is very important so that the results of the measurement can be used in a common framework for comparisons and understanding. The standard source of traceability for Short-Open-Load-Thru (SOLT) calibrations has
Displaying 201 - 225 of 3118
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