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Numerical Modelling and the Uncertainty Analysis of Transistor Noise-Parameter Measurements

Published

Author(s)

James P. Randa

Abstract

This paper provides an overview of the use of noise parameters as a numerical model to represent the noise characteristics of transistors, particularly in the context of a Monte Carlo evaluation of the uncertainties in noise-parameter measurements. The Monte Carlo also relies on a numerical model of the measurement process, in order to generate simulated measurement results, and this numerical model is also reviewed.
Citation
International Journal of Numerical Modelling-Electronic Networks Devices and Fields
Volume
28
Issue
6

Keywords

measurement simulation, noise measurement, transistor noise parameters.

Citation

Randa, J. (2014), Numerical Modelling and the Uncertainty Analysis of Transistor Noise-Parameter Measurements, International Journal of Numerical Modelling-Electronic Networks Devices and Fields, [online], https://doi.org/10.1002/jnm.2039 (Accessed July 20, 2024)

Issues

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Created December 5, 2014, Updated November 10, 2018