TY  - JOUR
AU  - James Randa
C2  - International Journal of Numerical Modelling-Electronic Networks Devices and Fields
DA  - 2014-12-05
DO  - https://doi.org/10.1002/jnm.2039
LA  - en
M1  - 28
PB  - International Journal of Numerical Modelling-Electronic Networks Devices and Fields
PY  - 2014
TI  - Numerical Modelling and the Uncertainty Analysis of Transistor Noise-Parameter Measurements
ER  -