Amplifier and Transistor Noise-Parameter Measurements
James P. Randa
Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions, noise parameters are defined and the most common measurement strategies are presented, both for packaged amplifiers and for on-wafer transistors (or amplifiers). The uncertainty analysis for such measurements is reviewed, and check and verification methods are presented.
Wiley Encyclopedia of Electrical and Electronics Engineering