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Amplifier and Transistor Noise-Parameter Measurements

Published

Author(s)

James P. Randa

Abstract

Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions, noise parameters are defined and the most common measurement strategies are presented, both for packaged amplifiers and for on-wafer transistors (or amplifiers). The uncertainty analysis for such measurements is reviewed, and check and verification methods are presented.
Citation
Wiley Encyclopedia of Electrical and Electronics Engineering

Keywords

amplifier noise, noise figure, noise parameters, noise-parameter uncertainty analysis, transistor noise, uncertainty analysis, verification methods

Citation

Randa, J. (2014), Amplifier and Transistor Noise-Parameter Measurements, Wiley Encyclopedia of Electrical and Electronics Engineering, [online], http:/onlinelibrary.wiley.com/book (Accessed May 22, 2024)

Issues

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Created October 1, 2014, Updated January 27, 2020