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PUBLICATIONS

Amplifier and Transistor Noise-Parameter Measurements

Published

Author(s)

James P. Randa

Abstract

Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions, noise parameters are defined and the most common measurement strategies are presented, both for packaged amplifiers and for on-wafer transistors (or amplifiers). The uncertainty analysis for such measurements is reviewed, and check and verification methods are presented.
Citation
Wiley Encyclopedia of Electrical and Electronics Engineering
Pub Weblink
http:/onlinelibrary.wiley.com/book
Pub Type
Websites

Keywords

amplifier noise, noise figure, noise parameters, noise-parameter uncertainty analysis, transistor noise, uncertainty analysis, verification methods
Electromagnetics and Metrology

Citation

Randa, J. (2014), Amplifier and Transistor Noise-Parameter Measurements, Wiley Encyclopedia of Electrical and Electronics Engineering, [online], http:/onlinelibrary.wiley.com/book (Accessed March 22, 2025)

Issues

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Created October 1, 2014, Updated January 27, 2020