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Search Publications

NIST Authors in Bold

Displaying 17051 - 17075 of 73697

Chemical Kinetics and Photochemical Data for Use in Atmospheric Studies, Evaluation No. 18

October 30, 2015
Author(s)
Vladimir L. Orkin, James B. Burkholder, S. P. Sander, J. P. D. Abbatt D. Abbatt, J. R. Barker, Robert E. Huie, C E. Kolb, Michael J. Kurylo III, David M. Wilmouth, P. H. Wine
This is the eighteenth in a series of evaluated sets of rate constants, photochemical cross sections, heterogeneous parameters, and thermochemical parameters compiled by the NASA Panel for Data Evaluation. The data are used primarily to model stratospheric

Design and calibration of an artifact for evaluating laser scanning articulating arm CMMs used for measuring complex non-concurrent surfaces

October 30, 2015
Author(s)
Vincent D. Lee, Steven D. Phillips, Craig M. Shakarji, Jeffrey Hosto, Jeffrey Huber, Gillich Barbara
Dimensional metrology is a foundational science finding applications throughout modern technology, including the testing of human-worn body armor designed to mitigate damage from kinetic projectiles fired from small arms. We describe the design and

Towards the Development of a Documentary Standard for Derived-Point to Derived-Point Distance Performance Evaluation of Spherical Coordinate 3D Imaging Systems

October 30, 2015
Author(s)
Balasubramanian Muralikrishnan, Katharine M. Shilling, Prem K. Rachakonda, Wei Ren, Vincent D. Lee, Daniel S. Sawyer
This paper describes ongoing research work within the Dimensional Metrology Group (DMG) at the National Institute of Standards and Technology (NIST) in support of the development of a documentary standard for derived-point to derived-point distance

A Neural Network Meta-Model and its Application for Manufacturing

October 29, 2015
Author(s)
David J. Lechevalier, Ronay Ak, Steven Hudak, Yung-Tsun T. Lee, Sebti Foufou
Manufacturing generates a vast amount of data both from operations and simulation. Extracting appropriate information from this data can provide insights to increase a manufacturer's competitive advantage through improved sustainability, productivity, and

Automated uncertainty quantification analysis using system model and data

October 29, 2015
Author(s)
Saideep Nannapaneni, Sankaran Mahadevan, David Lechevalier, Anantha Narayanan Narayanan, Sudarsan Rachuri
Understanding the sources of, and quantifying the magnitude of, uncertainty can improve decision-making and, thereby, make manufacturing systems more efficient. Accomplishing all of them requires knowledge in four separate domains: statistics, data science

Millimeter-Wave Near-Field Measurements Using Coordinated Robotics

October 29, 2015
Author(s)
Joshua A. Gordon, David R. Novotny, Michael H. Francis, Ronald C. Wittmann, Alexandra Curtin, Miranda L. Butler, Jeffrey R. Guerrieri
The National Institute of Standards and Tech- nology (NIST) recently developed a new robotic scan- ning system for performing near-field measurements at millimeter-wave frequencies above 100 GHz, the CROMMA (Configurable Robotic Millimeter-Wave Antenna)

The NIST IAD Data Science Evaluation Series: Part of the NIST Information Access Division Data Science Research Program

October 29, 2015
Author(s)
Bonnie J. Dorr, Craig Greenberg, Peter Fontana, Mark A. Przybocki, Marion Le Bras, Cathryn A. Ploehn, Oleg Aulov, Wo L. Chang
The Information Access Division (IAD) of the National Institute of Standards and Technology (NIST) launched a new Data Science Research Program (DSRP) in the fall of 2015. This research program focuses on evaluation-driven research and will establish a new

A "Smart Component" Data Model in PLM

October 28, 2015
Author(s)
Yunpeng Li, Utpal Roy, Seungjun Shin, Yung-Tsun Lee
Today's physical products are becoming smarter not only because of their increasingly complex functionalities, but also for their superior capabilities of adaptation to dynamic working environment based on embedded software and real-time information

A Profile for U. S. Federal Cryptographic Key Management Systems

October 28, 2015
Author(s)
Elaine B. Barker, Miles Smid, Dennis Branstad
This Profile for U. S. Federal Cryptographic Key Management Systems (FCKMSs) contains requirements for their design, implementation, procurement, installation, configuration, management, operation, and use by U. S. Federal organizations. The Profile is

Guide to Application Whitelisting

October 28, 2015
Author(s)
Adam Sedgewick, Murugiah Souppaya, Karen Scarfone
An application whitelist is a list of applications and application components that are authorized for use in an organization. Application whitelisting technologies use whitelists to control which applications are permitted to execute on a host. This helps

Order-Disorder and Phase Separation

October 28, 2015
Author(s)
Benjamin P. Burton
Order-disorder and phase separation in condensed solutions of two or more components are similar processes that are typically driven by energetics of opposite sign. The components may be: different atomic species in alloys or solid solutions; atoms and
Displaying 17051 - 17075 of 73697
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