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Displaying 1651 - 1675 of 2084

Chapter 12: Analysis of Individual Collected Particles

January 1, 2001
Author(s)
Robert A. Fletcher, John A. Small, J H. Scott
This chapter describes microscopes and microprobes used for analysis of collected, individual particles. The instruments discussed are the light microscope, electron microscopes (scanning, environmental and transmission), electron microprobes, laser

Embracing Uncertainty: Modeling Uncertainty in EPMA - Part II

January 1, 2001
Author(s)
Nicholas Ritchie
This, the second in a series of articles present a new framework for considering the computation of uncertainty in electron excited X-ray microanalysis measurements, will discuss matrix correction. The framework presented in the first article will be

Fundamentals of Mass Spectrometry of Organic Compounds

January 1, 2001
Author(s)
Anzor I. Mikaia, Vladimir G. Zaikin, Alexey V. Varlamov, Nikolay A. Prostakov
The book is about mass spectrometry, design of instruments, theoretical aspects and methodological approaches, includes exercises. Portions of the book developed from lecture and laboratory material used presenting a course in organic mass spectrometry at

Quantitative Proteomic Profiling of Prematurely Senescent ARPE-19 Cells

January 1, 2001
Author(s)
Illarion Turko, Wei-Li Liao
Senescence of retinal pigment epithelial (RPE) cells is a crucial event in the pathogenesis of age-related macular degeneration (AMD). ARPE-19 is a nontransformed human RPE cell line that displays many differentiated properties typical of RPE in vivo. The

Sum Frequency Spectroscopy Studies of Adsorption of Additives on Metal/Electrolyte Interfaces

November 1, 2000
Author(s)
Clayton S. Yang, Lee J. Richter, Kimberly Briggman, John C. Stephenson, Thomas P. Moffat, Gery R. Stafford
In situ and ex situ VR-SFG studies of mercaptopropylsulfonate (MPSA) molecules adsorbed on metal/electrolyte interfaces prove the molecular conformation is sensitive to hydration. MPSA catalyses electrodeposition of copper interconnection for semiconductor

Low-Level (Submicromole) Environmental 14 C Metrology

October 1, 2000
Author(s)
Lloyd A. Currie, J D. Kessler, J V. Marolf, A. P. McNichol, D R. Stuart, J C. Donoghue, D. J. Donahue, William Burr, D Biddulph
Accelerator Mass Spectrometry (AMS) measurements of environmental 14C have been employed during the past decade at the several micromole level (10's of ug carbon), but advanced research in the atmospheric and marine sciences demands still higher

NIST Data Resources for X-Ray Photoelectron Spectroscopy

October 1, 2000
Author(s)
Cedric J. Powell
A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an Elastic
Displaying 1651 - 1675 of 2084
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