An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
https://www.nist.gov/publications/search
Search Publications
NIST Authors in Bold
Displaying 1601 - 1625 of 2724
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the
These specifications and tolerances are recommended as minimum requirements for standards used by state and local weights and measures officials and others in the regulatory verification of meters used in quantity determination of pressurized liquid
Jun-Feng Song, Theodore V. Vorburger, Robert M. Thompson, Thomas Brian Renegar, Xiaoyu Alan Zheng, Li Ma, James H. Yen, Martin Ols
The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 bullets and 2461 casings. NIST and ATF are proposing to
These specifications and tolerances are recommended as minimum requirements for standards used by state and local weights and measures officials and others in the regulatory verification of meters used in quantity determination of liquid commodities. Other
Tsai Hong Hong, Elena R. Messina, Hui-Min Huang, Michael O. Shneier, Roger D. Eastman, Jane Shi, James Wells
The Dynamic Perception workshop was intended to further the development of standardized, reproducible, and portable test methods that can advance the technology of sensors and perception systems for new, flexible robotic and automation applications in
The vibrations of the cold finger of a low-vibration helium pulse-tube cryostat are measured from 1 Hz to 20 kHz using an optical interferometer specially designed to measure small vibrations at high frequencies in the presence of large vibrations at lower
Olivio Pereira de Oliveira, Willy De Bolle, Stefan Richter, Adolfo Alonso, Emmanuel Ponzevera, Christophe Qu?tel, Jorge Eduardo de Souza Sarkis, Roger Wellum, Ruediger Kessel
The metrological compatibility of n(234U)/n(238U), n(235U)/n(238U) and n(236U)/n(238U) isotope amount ratio measurement results performed by gas source mass spectrometry (GSMS), thermal ionisation mass spectrometry (TIMS) and multi-collector inductively
A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions will
Roger D. Eastman, Tsai H. Hong, Jane Shi, Tobias Hanning, Bala Muralikrishnan, S. S. Young, Tommy Chang
Real-time three-dimensional vision has been rapidly advancing over the past twenty years, leading to a number of successful laboratory demonstrations, including real-time visual servoing, autonomous vehicle navigation , and real-time people and vehicle
Igor Vayshenker, Shao Yang, Kuniaki Amemiya, Seiji Mukai, T. Zama
We compare the results of measurements of the nonlinearity of high-power optical fiber powermeters (OFPMs) by two national metrology institutes (NMIs): the National Institute of Standards and Technology (NIST-USA) and the National Metrology Institute of
Linda D. Crown, Steven E. Cook, Tina G. Butcher, Lisa Warfield, Ralph A. Richter
This is the agenda for the four Standing Committees of the National Conference on Weights and Measures - 95th Interim Meeting. This meeting will beheld at the Hilton Nashville Downtown, Nashville, Tennessee, on January 24 to 27, 2010
Use of metric labeling on United States consumer products has a long history. Currently, the Fair Packaging and Labeling Act (FPLA) requires dual unit labeling, while products regulated by states under the Uniform Packaging and Labeling Regulation (UPLR)
Daniel A. Fischer, Saloman Turgman-Cohen, P K. Kilpatrick, Jan Genzer
The adsorption of asphaltenes onto flat silica surfaces modified with self-assembled monolayers (SAMs) of alkyltrichlorosilanes of varying thickness due to a variable number of carbon atoms (NC) has been studied by means of contact angle measurements
Jun-Feng Song, Theodore V. Vorburger, Susan M. Ballou, Li Ma, Thomas Brian Renegar, Xiaoyu Alan Zheng, Martin Ols
The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 Bullets and 2461 Casings. NIST has also developed a 2D
We review the progress in acoustic metrology of gases that has occurred since the 1988 measurement of the universal gas constant R using a spherical acoustic resonator. The advances in understanding resonators and in calculating the thermophysical
There is a great need for high accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). In this presentation we propose evaluating the viability of the newly developed through
Current research is probing transport on ever smaller scales. Modeling of the electromagnetic interaction with nanoparticles or small collections of dipoles and its associated the energy transport and nonequilibrium characteristics requires a detailed
Handbook 44 was first published in 1949, having been preceded by similar handbooks of various designations and in several forms. This 2010 edition was developed by the Committee on Specifications and Tolerances of the National Conference on Weights and
Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and
Donald A. Windover, David L. Gil, Albert Henins, James P. Cline
NIST recently released a standard reference material (SRM) for the calibration of high resolution X-ray diffraction (HRXRD) instruments. HRXRD is extensively used in the characterization of lattice distortion in thin single, epitaxial crystal layers on