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NIST Authors in Bold

Displaying 1426 - 1450 of 2189

NIST Calibration Services for Water Flowmeters Water Flow Calibration Facility

August 1, 2006
Author(s)
Iosif I. Shinder, Iryna V. Marfenko
This document describes the Water Flow Calibration Facility (WFCF) at the National Institute of Standards and Technology (NIST). This facility has three parallel pipelines with diameters of 100, 200 and 400 mm and three weighing systems with capacities of

The Evaluation of Ontologies

August 1, 2006
Author(s)
Leo Obrst, Benjamin Ashpole, Werner Ceusters, Mahesh Mani, Steven R. Ray, Bradford Smith
Recent years have seen rapid progress in the development of ontologies as semantic models intended to capture and represent aspects of the real world. There is, however, great variation in the quality of ontologies. If ontologies are to become

Probe-Based Micro-Scale Manipulation and Assembly Using Force Feedback

June 26, 2006
Author(s)
Jason J. Gorman, Nicholas Dagalakis
Repeatable manipulation and assembly of micro-scale components is a critical capability for future developments in opto-electronics, hybrid microelectromechanical systems, and the integration of nano-scale devices into larger systems. This paper focuses on

A Web Service-Based Reconfigurable Testbed for Business-to-Business (B2B) Integration

June 1, 2006
Author(s)
B Jeong, Jungyub Woo, Hyunbo Cho, Boonserm Kulvatunyou, James Lee
Several types of standards and corresponding software solutions have been created to enable business-to-business (B2B) integration. Testing for conformance and interoperability among these solutions are inter-dependent. This signifies the needs to make

Implementing XML Schema Naming and Design Rules

June 1, 2006
Author(s)
Joshua Lubell, Boonserm Kulvatunyou, Katherine C. Morris, Betty Harvey
We are building a methodology and tool kit for encoding XML schema Naming and Design Rules (NDRs) in a computer-interpretable fashion, enabling automated rule enforcement and improving schema quality. Through our experience implementing rules from various

Representation of Heterogeneous Material Properties in the Core Product Model

June 1, 2006
Author(s)
Arpan Biswas, Steven J. Fenves, V Shapiro, Ram D. Sriram
The Core Product Model (CPM) was developed at NIST as a high level abstraction for representing product related information, to support data exchange, in a distributive and a collaborative environment. In this paper, we extend the CPM to components with

Special Issue on Collaborative Engineering

June 1, 2006
Author(s)
Ram D. Sriram, Simon Szykman, D Durham
Design of complex engineering systems is increasingly becoming a collaborative task among designers or design teams that are physically, geographically, and temporally distributed. The complexity of modern products means that a single designer or design

User Interface of Simulation of the Shipbuilding Operations

June 1, 2006
Author(s)
Guodong Shao, Charles R. McLean, Swee K. Leong
This paper discusses the development of the user interface for a simulation of the shipbuilding operations. It presents an overview of a generic simulation of shipbuilding operations, the simulation system's user profiles, and the user interface screen

Damping mechanisms for precision applications in UHV environment

May 1, 2006
Author(s)
Sumanth B. Chikkamaranahalli, R. R. Vallance, Bradley N. Damazo, Richard M. Silver
Surface analysis techniques such as scanning probe microscopy (SPM) have undergone significant advances and are attractive for application to electron and optical devices such as micro lenses, vacuum tubes, electron tubes, etc. For surface stability

Manufacturing Interoperability

May 1, 2006
Author(s)
Steven R. Ray, Albert T. Jones
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA ABSTRACT: As manufacturing and commerce become ever more global in nature, companies are increasingly dependent upon the efficient and effective exchange of information with their

Experience in the Exchange of Procedural Shape Models Using ISO 10303 (STEP)

March 30, 2006
Author(s)
Mike Pratt, Junhwan Kim
The international standard ISO 10303 (STEP) is being extended to permit the exchange of procedurally defined shape models, with additional parameterization and constraint information, between CAD systems. The transfer of parameterized assembly models is an

Bias Reduction in Roughness Measurement through SEM Noise Removal

March 24, 2006
Author(s)
R Katz, C D. Chase, R Kris, R Peltinov, John S. Villarrubia, B Bunday
The importance of Critical Dimension (CD) roughness metrics such as Line and Contact edge roughness (LER, CER) and their associated width metrics (LWR, CWR) have been dealt with widely in the literature and are becoming semiconductor industry standards

Early Results From the NIST M48 CMM in the New AML Facility

March 3, 2006
Author(s)
John R. Stoup, Bryon S. Faust, Theodore D. Doiron
The Advanced Measurement Laboratory at NIST in Gaithersburg has already provided real, measurable improvement in some dimensional metrology measurement processes at NIST, most notably in the performance of the NIST Moore M48 coordinate measuring machine1

Assembly Model Representation from Conceptual to the Detailed Design

March 1, 2006
Author(s)
Sudarsan Rachuri, Y H. Han, Sebti Foufou, Shaw C. Feng, Utpal Roy, Fujun Wang, Ram D. Sriram, Kevin W. Lyons
The important issue of mechanical assemblies has been a subject of intense research over the past several years. Most electromechanical products are assemblies of several components, for various technical as well as economic reasons. This paper provides an

Koehler Illumination for High-Resolution Optical Metrology

March 1, 2006
Author(s)
Martin Y. Sohn, Bryan M. Barnes, Lowell P. Howard, Richard M. Silver, Ravikiran Attota, Michael T. Stocker
Accurate preparation of illumination is critical for high-resolution optical metrology applications such as line width and overlay measurements. To improve the detailed evaluation and alignment of the illumination optics, we have separated Koehler

Progress on Implementation of a CD-AFM Based Reference Measurement System

March 1, 2006
Author(s)
Ndubuisi G. Orji, Angela Martinez, Ronald G. Dixson, J Allgair
The National Institute of Standards and Technology (NIST) and SEMATECH are working to address traceability issues in semiconductor dimensional metrology. In semiconductor manufacturing, many of the measurements made in the fab are not traceable to the SI

The Limits of Image-Based Optical Metrology

March 1, 2006
Author(s)
Richard M. Silver, Bryan M. Barnes, Ravikiran Attota, Jay S. Jun, James J. Filliben, Juan Soto, Michael T. Stocker, P Lipscomb, Egon Marx, Heather J. Patrick, Ronald G. Dixson, Robert D. Larrabee
An overview of the challenges encountered in imaging device-sized features using optical techniques recently developed in our laboratories is presented in this paper. We have developed a set of techniques we refer to as scatterfield microscopy which allows

Traceable Atomic Force Microscope Dimensional Metrology at NIST

March 1, 2006
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, Michael W. Cresswell, Richard A. Allen, William F. Guthrie
The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. There are two major instruments being used for traceable measurements at NIST. The first is a custom in-house

A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers

January 1, 2006
Author(s)
Arvind K. Balijepalli, Thomas W. LeBrun, Satyandra K. Gupta
The optical tweezers instrument is a unique tool for directed assembly of nanocomponents. In order to function as a viable nanomanufacturing tool, a software architecture is needed to run the optical tweezers hardware, provide an effective user interface

Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques

January 1, 2006
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Thomas Brian Renegar, Hyug-Gyo Rhee, A Zheng, L Ma, John M. Libert, Susan M. Ballou, B Bachrach, K Bogart
Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the measurements of bullet profile signatures of a NIST (National Institute of Standards and
Displaying 1426 - 1450 of 2189
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