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Displaying 1426 - 1450 of 4224

Measurement Science Needs for Real-time Control of Additive Manufacturing Powder Bed Fusion Processes

March 15, 2015

Author(s)

Mahesh Mani, Brandon M. Lane, M A. Donmez, Shaw C. Feng, Shawn P. Moylan, Ronnie R. Fesperman Jr.

Additive Manufacturing is increasingly used in the development of new products: from conceptual design to functional parts and tooling. However, today, variability in part quality due to inadequate dimensional tolerances, surface roughness, and defects

Performance Evaluation Methods for Human Detection and Tracking Systems for Robotic Applications

March 14, 2015

Author(s)

Michael O. Shneier, Tsai H. Hong, Kamel S. Saidi, William P. Shackleford

Detecting and tracking people is becoming more important in robotic applications because of the increasing demand for collaborative work in which people interact closely with and in the same workspace as robots. New safety standards allow people to work

Proceedings of the Measurement Science for Sustainable Construction and Manufacturing Workshop Volume II. Presentations

March 2, 2015

Author(s)

Bilal Ayyub, Gerald Galloway, Richard Wright

This report documents the effort launched by the National Institute of Standards and Technology (NIST) to develop, organize, and convene a workshop on sustainability to promote the adoption and use of sustainable construction and manufacturing and guide

Additive Manufacturing: Current State, Future Potential, Gaps & Needs, and Recommendations

February 27, 2015

Author(s)

Yong Huang, Ming Leu, Jyoti Mazumder, Alkan Donmez

Additive manufacturing (AM), the process of joining materials to make objects from three-dimensional (3D) model data, usually layer by layer, is distinctly different from and has many advantages over traditional manufacturing processes. Commonly known as

Characterizing Task-Based Human-Robot Collaboration Safety in Manufacturing

February 27, 2015

Author(s)

Jeremy A. Marvel, Joseph A. Falco, Ilari Marstio

A new methodology for describing the safety of human-robot collaborations is presented. Taking a task-based perspective, a risk assessment of a collaborative robot system safety can be evaluated offline during the initial design stages. This risk

Measurement Science for Sustainable Construction and Manufacturing: A NIST Perspective

February 21, 2015

Author(s)

Robert E. Chapman, Joannie W. Chin, Sudarsan Rachuri, Joshua D. Kneifel, Andrew K. Persily, Anthony Hamins

Effects of wafer noise on the detection of 20 nm defects using optical volumetric inspection

February 11, 2015

Author(s)

Bryan M. Barnes, Francois R. Goasmat, Martin Y. Sohn, Hui Zhou, Andras Vladar, Richard M. Silver

Patterning imperfections in semiconductor device fabrication may either be noncritical [e.g., line edge roughness (LER)] or critical, such as defects that impact manufacturing yield. As the sizes of the pitches and linewidths decrease in lithography

Thermographic and FE Simulation of the DMLS Process at NIST

February 4, 2015

Author(s)

Brandon M. Lane, Li Ma, Shawn P. Moylan, M A. Donmez, Eric P. Whitenton, Daniel J. Falvey

A major effort of the Measurement Science for Additive Manufacturing Program at NIST is to provide high quality, well-defined temperature measurement of the DMLS process to support and validate multi-physics simulations. However, the dynamic, complex

Roadmapping Workshop  Measurement Science for Prognostics and Health Management for Smart Manufacturing Systems

January 16, 2015

Author(s)

Brian A. Weiss

A Decision Guidance Framework for Sustainability Performance Analysis of Manufacturing Processes

January 10, 2015

Author(s)

Duck B. Kim, Seungjun Shin, Guodong Shao, Alexander Brodsky

Life-Cycle Assessment (LCA) methods are widely used to assess the sustainability of manufacturing processes. Although it has several advantages such as systematic estimation and efficiency, it has significant limitations due to lack of functionality to

Low-Loss Electron Imagine for Enhanced Surface Detail in the Scanning Electron Microscope: The Contributions of Oliver C. Wells

January 7, 2015

Author(s)

Michael T. Postek, Andras Vladar

Low-loss electron (LLE) imaging in the scanning electron microscope (SEM) is based on the collection of energy-filtered backscattered electrons that have undergone minimal elastic interactions within a sample and therefore can carry high-resolution

Streamlining the Additive Manufacturing Digital Spectrum: A Systems Approach

January 1, 2015

Author(s)

Paul W. Witherell

Measuring Impact of Cybersecurity on the Performance of Industrial Control Systems

December 31, 2014

Author(s)

Keith A. Stouffer, Richard Candell

The National Institute of Standards and Technology (NIST) is developing a cybersecurity testbed for industrial control systems (ICS). The goal of the testbed is to measure the performance of ICS when instrumented with cybersecurity countermeasures in

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