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Displaying 1301 - 1325 of 1938

Multi-sample micro-slit rheometry

September 17, 2008
Author(s)
Doyoung Moon, Anthony J. Bur, Kalman D. Migler
We have developed a multi-sample micro-slit rheometer MMR which is capable of measurements over a broad range of temperatures, viscosities and shear rates. The instrument is mechanically simple as the flow is generated by external gas pressure and the

Piezoelectric Response of Nanoscale PbTiO3 in Composite PbTiO3-CoFe2O4 Epitaxial Films

August 15, 2008
Author(s)
Igor Levin, Tan Zhuopeng, Alexander Roytburd, Katyayani Seal, Brian Rodriguez, Stephen Jesse, Sergei Kalinin, Art Baddorf
Piezoelectric properties of PbTiO3 in 1/3PbTiO3-2/3CoFe2O4 transverse epitaxial nanostructures on differently oriented SrTiO3 were analyzed using conventional and switching-spectroscopy piezoelectric force microscopy. The results confirmed that the

Systematic oxidation of polystyrene by ultraviolet-ozone,characterized by near edge x-ray absorption fine structure and contact angle

August 5, 2008
Author(s)
Daniel A. Fischer, Robert Klein, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart
The process of implanting oxygen in polystyrene (PS) via exposure to ultraviolet-ozone (UV-O) was systematically investigated using the characterization technique of near edge x-ray absorption fine structure (NEXAFS). Samples of PS exposed to UV-O for 10s

Diffusive and convective mass transfer in two-phase flow in microchannels

August 3, 2008
Author(s)
Steven D. Hudson, Jai A. Pathak, Jeffrey D. Martin
The kinetics of mass transfer from one phase to another is monitored in flow. The time-dependent interfacial tension between water and oil (determined from drop deformation dynamics in situ) serves as a measure of the butanol concentration within the drop

Nanoimprint Lithography and the Role of Viscoelasticity in the Generation of Residual Stress in Model Polystyrene Patterns

June 10, 2008
Author(s)
Yifu Ding, Hyun Wook Ro, Jing N. Zhou, Brian C. Okerberg, Jack F. Douglas, Alamgir Karim, Christopher L. Soles
Understanding polymer deformation during the nanoimprinting process is key to achieve robust polymer nanostructures. Information regarding the process can be extracted from monitoring the decay of the imprinted polymer patterns during thermal annealing. In

The Role of Folding in the Degradation of Ballistic Fibers

May 19, 2008
Author(s)
Walter G. McDonough, Gale A. Holmes, Jae Hyun Kim, Derek L. Ho
Research has indicated that the folding of ballistic fibers comprising soft body armor may be a factor in the performance deterioration that has been observed. To quantify the impact of this failure mechanism on body armor performance, an apparatus was

The Impact of the Dielectric / Semiconductor Interface on Microstructure and Charge Carrier Transport in High-Performance Polythiophene Transistors

May 14, 2008
Author(s)
Youngsuk Jung, Regis J. Kline, Eric K. Lin, Daniel A. Fischer, Michael F. Toney, Martin Heeney, Iain McCulloch, Dean DeLongchamp
The performance of organic field-effect transistors (OFETs) significantly depends on the properties of the interface between the semiconductor and gate dielectric. Here, we study the impact of chemically modified and morphologically controlled dielectrics

EVALUATION OF MULTI-SAMPLE MICRO-CAPILLARY RHEOMETER

May 5, 2008
Author(s)
Doyoung Moon, Anthony J. Bur, Kalman D. Migler
We present a Multi-sample Micro-capillary Rheometer (MMR) which is capable of measurements over a broad range of temperatures, viscosities and shear rates. The instrument is simple as the flow is generated by external gas pressure and the shear rate is

Nanotwin formation and its physical properties and effect on reliability of copper interconnects.

May 3, 2008
Author(s)
Di Xu, Vinay Sriram, Vidvuds Ozolins, Jenn-Ming Yang, K. N. Tu, Gery R. Stafford, Carlos R. Beauchamp, Inka Zienert, Holm Geisler, Petra Hofmann, Ehrenfried Zschech
Ultra-fine grained copper with a large amount of nano-scale twin boundaries has high mechanical strength and maintain normal electrical conductivity. The combination of these properties may lead to promising applications in future Si microelectronic
Displaying 1301 - 1325 of 1938
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