Kim, S.
, Sehgal, A.
, Karim, A.
and Fasolka, M.
(2008),
Techniques for Combinatorial and High-Throughput Microscopy. Part2: Automated Optical Microscopy Platform for Thin Films Research, Microscopy Today, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852280
(Accessed December 6, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Techniques for Combinatorial and High-Throughput Microscopy. Part2: Automated Optical Microscopy Platform for Thin Films Research
Published
Author(s)
S D. Kim, , ,
Abstract
An automated optical microscopy system was developed for the high-throughput measurement of morphology evolution in combinatorial specimen libraries. Designed specifically for gradient thin film specimens, the platform was developed to track iso-parametric contour lines, control focus motors, regulate timing operations and perform image analysis. In addition, an example study on a fabricated gradient specimen concerning polymer thin film stability is discussed.Citation
Microscopy Today
Volume
October 2008
Pub Type
Journals
Download Paper
Keywords
combinatoral methods, film thickness, gradient libraries, hig-throughput materials science, surface energy gradient, temperature, thin films
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 30, 2008, Updated October 12, 2021