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Techniques for Combinatorial and High-Throughput Microscopy. Part2: Automated Optical Microscopy Platform for Thin Films Research

Published

Author(s)

S D. Kim, A Sehgal, Alamgir Karim, Michael J. Fasolka

Abstract

An automated optical microscopy system was developed for the high-throughput measurement of morphology evolution in combinatorial specimen libraries. Designed specifically for gradient thin film specimens, the platform was developed to track iso-parametric contour lines, control focus motors, regulate timing operations and perform image analysis. In addition, an example study on a fabricated gradient specimen concerning polymer thin film stability is discussed.
Citation
Microscopy Today
Volume
October 2008

Keywords

combinatoral methods, film thickness, gradient libraries, hig-throughput materials science, surface energy gradient, temperature, thin films

Citation

Kim, S. , Sehgal, A. , Karim, A. and Fasolka, M. (2008), Techniques for Combinatorial and High-Throughput Microscopy. Part2: Automated Optical Microscopy Platform for Thin Films Research, Microscopy Today, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852280 (Accessed April 14, 2024)
Created September 30, 2008, Updated October 12, 2021