Techniques for Combinatorial and High-Throughput Microscopy. Part2: Automated Optical Microscopy Platform for Thin Films Research
S D. Kim, A Sehgal, Alamgir Karim, Michael J. Fasolka
An automated optical microscopy system was developed for the high-throughput measurement of morphology evolution in combinatorial specimen libraries. Designed specifically for gradient thin film specimens, the platform was developed to track iso-parametric contour lines, control focus motors, regulate timing operations and perform image analysis. In addition, an example study on a fabricated gradient specimen concerning polymer thin film stability is discussed.