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Displaying 1226 - 1250 of 1921

Vapor Entraining Magnetic Mixer for Reaction and Equilibrium Applications

March 1, 2001
Author(s)
Thomas J. Bruno, Michael C. Rybowiak
Mixing of fluids is a central component to innumerable operations in chemical processing on the plant floor and also in many laboratory operations. Most mixing applications simply require the efficient blending of fluids present in a single phase, such as

Evanescent-Wave Cavity Ring-down Spectroscopy for Trace Water Detection

February 1, 2001
Author(s)
A C. Pipino, Joseph T. Hodges
We explore the use of evanescent wave cavity ring-down spectroscopy (EW-CRDS) for water detection through a signal-to-noise ratio analysis. Cavity ring-down spectroscopy (CRDS) is an emerging optical absorption technique that employs the mean photon decay

Laminar Flow of Four Gases Through a Helical Rectangular Duct

February 1, 2001
Author(s)
Robert F. Berg, S A. Tison
We report measurements and a model of gas flow through a helical duct of rectangular cross section. The measurements on helium, nitrogen, argon, and sulfur hexafluoride yielded molar flow rates from observations of the rate of rise of pressure in a known

Technical Activities 2000 - Chemical Science and Technology Laboratory

February 1, 2001
Author(s)
Hratch G. Semerjian, W Koch
This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and Technology for Fiscal Year 2000. The report includes: a general overview of the laboratory's activities

Chapter 12: Analysis of Individual Collected Particles

January 1, 2001
Author(s)
Robert A. Fletcher, John A. Small, J H. Scott
This chapter describes microscopes and microprobes used for analysis of collected, individual particles. The instruments discussed are the light microscope, electron microscopes (scanning, environmental and transmission), electron microprobes, laser

Cluster Primary Ion Beam Secondary Ion Mass Spectrometry for Semiconductor Characterization

January 1, 2001
Author(s)
John G. Gillen, S V. Roberson, Albert J. Fahey, Marlon L. Walker, J Bennett, R Lareau
We are evaluating the use of polyatomic and cluster primary ion beams for characterization of semiconductor materials by secondary ion mass spectrometry using both magnetic sector and time-of-flight SIMS instruments. Primary ion beams of SF 5+, C 8- and

Fundamentals of Mass Spectrometry of Organic Compounds

January 1, 2001
Author(s)
Anzor I. Mikaia, Vladimir G. Zaikin, Alexey V. Varlamov, Nikolay A. Prostakov
The book is about mass spectrometry, design of instruments, theoretical aspects and methodological approaches, includes exercises. Portions of the book developed from lecture and laboratory material used presenting a course in organic mass spectrometry at
Displaying 1226 - 1250 of 1921
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