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Displaying 1176 - 1200 of 2189

From Simulation to Real Robots with Predictable Results: Methods and Examples

December 1, 2009
Author(s)
Stephen B. Balakirsky, Stefano Carpin, George Dimitoglou, Benjamin Balaguer
From a theoretical perspective, one may easily argue (as we will in this chapter) that simulation accelerates the algorithm development cycle. However, in practice many in the robotics development community share the sentiment that "Simula-tion is doomed

STEPNC++ - An Effective Tool for Feature-based CAM/CNC

December 1, 2009
Author(s)
John L. Michaloski, Thomas R. Kramer, Frederick M. Proctor, Xun Xu, Sid Venkatesh, David Odendahl
This chapter discusses the realization of direct translation of feature-based CAM files into feature-based CNC part program files. The information infrastructure that allows this to happen is STEP-NC, as described by ISO 14649 Parts 10 and 11. Among the

Traceability for Ballistics Signature Measurements in Forensic Science

December 1, 2009
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Susan M. Ballou, Li Ma, Thomas Brian Renegar, Xiaoyu Alan Zheng, Martin Ols
The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 Bullets and 2461 Casings. NIST has also developed a 2D

Performance Measurements Towards Improved Manufacturing Vehicle Safety

November 23, 2009
Author(s)
Roger V. Bostelman, William P. Shackleford
In this paper, we describe the current 2D (dimensional) sensor and ideal sensor configurations if 3D imagers are mounted on manufacturing vehicles in an attempt to make them more safe. Towards the ideal sensor configuration, three experiments were

An Enabler for Supplier Discovery in Virtual Supply Chains: A Shared Terminology

November 5, 2009
Author(s)
Steven J. Fenves, Eswaran Subrahmanian, Mahesh Mani, Albert T. Jones
Rigid supply-chain organizational structures are giving way to highly dynamic collaborative partnerships. These partnerships will develop rapidly by composing global manufacturing resources in response to open market opportunities; and, they will disband

Interoperability and the DMIS experience

October 30, 2009
Author(s)
John A. Horst
Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and

Ontological Product Modeling for Collaborative Design

October 30, 2009
Author(s)
Conrad E. Bock, XuanFang Zha, Hyo W. Suh, Jae H. Lee
This paper presents a product modeling language for collaborative design that has the benefits of ontology and expanded capabilities in conventional product modeling. The proposed approach uses ontology to increase flexibility and accuracy in combining

Towards a Global Interoperability Test Bed for eBusiness Systems

October 21, 2009
Author(s)
Nenad Ivezic, Hyunbo Cho, Jungyub Woo, Jun H. Shin, Jaewook Kim, Mohammad Abidi, Asuman Dogac, Tuncay Namli, Christine Legner, Francois Fischer
We describe an initial effort to create a comprehensive and coherent framework for feasibility analysis of the Global Interoperability Test Bed for eBusiness systems. Requirements from an initial set of three industrial use cases are driving the

Mathematical Metrology for Evaluating a 6DOF Visual Servoing System

October 8, 2009
Author(s)
Tommy Chang, Tsai H. Hong, Milli Shah, Roger D. Eastman
In this paper we develop the best homogeneous matrix trans- formation to fit two streams of dynamic six-degree-of-freedom (6DOF) data for evaluating perception systems using ground truth. In particular, we compare object position and orien- tation results

Quantifying the Performance of MT-Connect in a Distributed Manufacturing Environment

October 8, 2009
Author(s)
John L. Michaloski, Byeong Eon Lee, Frederick M. Proctor, Sid Venkatesh, Sidney Ly
In the CNC manufacturing world, the continuing pressure to reduce costs and improve time to market places a premium on smarter ways of manufacturing and intensifies the need to integrate feedback from the shop floor into the enterprise business systems

Ontology Formalisms: What is Appropriate for Different Applications?

October 6, 2009
Author(s)
Craig I. Schlenoff
Ontologies can take many forms. There are ontologies that are extremely formal (e.g., using first order logic), and there are ontologies that are much less formally defined (e.g., ontologies in the relational databases or dictionaries). Nonetheless, all of

A Service Oriented Framework for Construction Supply Chain Integration

October 1, 2009
Author(s)
Jack Cheng, Kincho H. Law, Albert T. Jones, Ram D. Sriram
Supply chain management integrates key business processes and facilities, involving end users and suppliers that provide products, services and information. Supply chain integration can potentially add value to the stakeholders along product development

Influence of room temperature control system on AFM imaging

October 1, 2009
Author(s)
Joseph Fu, Wei Chu, Theodore V. Vorburger
As technology progresses, the control of environment for experiments is also getting more sophisticated; such as the control of lab temperature and vibration. Temperature controlled within ± 0.25° C for a general purpose lab is common place. We illustrate

The Dimensional Markup Language Specification for Inspection Results Data

October 1, 2009
Author(s)
William G. Rippey
The Dimensional Markup Language (DML) specification defines a data model and Extensible Model Language (XML) encoding rules for dimensional inspection results for discrete parts. To support manufacturing quality assurance processes, DML results files are

Update on DMIS Certification

October 1, 2009
Author(s)
William G. Rippey
The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. The

Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment

September 25, 2009
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimensional

Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses

September 8, 2009
Author(s)
Gordon A. Shaw, Joseph J. Maurer, Steven E. Fick, Thomas P. Moffat, J. J. Mallett, John L. Hudson
Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Because of

Nanometrology Solutions Using an Ultra-High Resolution In-lens SEM

September 1, 2009
Author(s)
Michael T. Postek, Andras Vladar, John S. Villarrubia
The imaging and measurement of nanostructures such as particles, carbon nanotubes, and quantum dots have placed new demands on the high resolution imaging capabilities of scanning electron microscopes. A barrier to accurate dimensional metrology is the
Displaying 1176 - 1200 of 2189
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