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Search Publications

NIST Authors in Bold

Displaying 1151 - 1175 of 143606

Influence of Spectral Bandwidth on the Working Curve in Vat Photopolymerization

April 29, 2024
Author(s)
Benjamin Caplins, Thomas Kolibaba, Uwe Arp, C Cameron Miller, Yuqin Zong, Dianne L. Poster, Callie Higgins, Jason Killgore
In vat photopolymerization, 3-dimensional parts are fabricated by using patterned light to spatially cure a liquid resin. One of the foundational measurements for vat photopolymerization is known as the working curve whereby the depth (i.e. thickness) of

Operando XPS for Plasma Process Monitoring: A Case Study on the Hydrogenation of Copper Oxide Confined under h-BN

April 29, 2024
Author(s)
Trey Diulus, Andrew Naclerio, J. Anibal Boscoboinik, Ashley Head, Evgheni Strelcov, Piran Kidambi, Andrei Kolmakov
We demonstrate that ambient pressure x-ray photoelectron spectroscopy (APXPS) can be used for in situ studies of dynamic changes in surface chemistry in a plasma environment. Hexagonal boron nitride (h-BN) was used in this study as a model system since it

Shifts in belowground processes along a temperate forest edge

April 29, 2024
Author(s)
Rose Abramoff, Jeffrey Warren, Jessica Harris, Sarah Ottinger, Sarah Garvey, Joy Winbourne, Andrew Reinmann, David W. Allen, Lucy Hutyra, Margaret Torn, Melanie Mayes
Forests are increasingly fragmented and as a result most forests in the United States are within 1 km of an edge. Edges change environmental conditions of the forest - especially radiation, roughness, and temperature - that can have consequences for plant

Towards a resolution of the spin alignment problem

April 29, 2024
Author(s)
Mohammad Alhejji, Emanuel Knill
Consider the problem of minimizing the entropy of a mixture of states by choosing each state subject to constraints. If the spectrum of each state is fixed, we expect that in order to reduce the entropy of the mixture, we should make the states less

VDI/VDE 2634-2 and ISO 10360-13 Performance Evaluation Tests, and Systematic Errors in Structured Light Systems

April 29, 2024
Author(s)
Octavio Icasio Hernandez, Alex Rocha De La Cruz, Balasubramanian Muralikrishnan, Vincent Lee, Wei Ren, Jose-Joel Gonzalez-Barbosa
Structured light projection systems (SLSs) are commonly used for precision dimensional measurements. These are active systems in that the projected pattern is used to establish correspondence between the projector and the camera to provide more accurate 3D

Practical Attack on All Parameters of the DME Signature Scheme

April 28, 2024
Author(s)
Pierre Briaud, Maxime Bros, Ray Perlner, Daniel Smith-Tone
DME is a multivariate scheme submitted to the call for additional signatures recently launched by NIST. Its performance is one of the best among all the candidates. The public key is constructed from the alternation of very structured linear and non-linear

Spatial and Temporal Data Alignment from Disparate Sources for Feature Association

April 25, 2024
Author(s)
Benjamin Standfield, Eric Holterfield, Russell Waddell
Among the chief topic areas of Industry 4.0, digital thread technology offers the opportunity for increased productivity, efficiency, and traceability throughout a product's lifecycle. While the basic concept of digital thread is easy to realize by

Instrument Development for Spectroscopic Ellipsometry and Diffractometry in the EUV

April 24, 2024
Author(s)
Stephanie Moffitt, Bryan Barnes, Thomas A. Germer, Steven Grantham, Eric Shirley, Martin Sohn, Daniel Sunday, Charles S. Tarrio
Semiconductor devices are noted for ever-decreasing dimensions but now are also becoming more complex. While scanning probe microscopy can still resolve the smallest features, it does not have the throughput for high-volume characterization of full wafers

Tuning the Spontaneous Exchange Bias Effect in La1.5Sr0.5CoMnO6 with Sintering Temperature

April 24, 2024
Author(s)
C Macchiutti, J Jesus, F Carneiro, L Bufaical, Ryan Klein, Q. Zhang, M Kirkham, Craig Brown, R dos Reis, G. Perez, E. Bittar
Here, we present a study of the influence of microstructure on the magnetic properties of polycrystalline samples of the La1.5Sr0.5CoMnO6 double perovskite, with primary attention to the spontaneous exchange bias effect, a fascinating recently discovered

Dynamic acoustic optimization of pulse tube refrigerators for rapid cooldown

April 23, 2024
Author(s)
Ryan Snodgrass, Vincent Kotsubo, Scott Backhaus, Joel Ullom
Pulse tube refrigerators are a critical enabling technology for many disciplines that require low temperatures. These refrigerators dominate the total power consumption of most modern cryostats, including those that reach millikelvin temperatures using

Dynamic Calibration of Instrumented Charpy Strikers

April 22, 2024
Author(s)
Akobuije Chijioke, Nicholas Vlajic, Enrico Lucon
Charpy V-notch testing of metallic materials involves application of kilonewton-range force pulses on millisecond time scales, generated by impacting the notched test specimen with a striker mounted to a swinging pendulum. In the instrumented version of

Incorporating Syncable Authenticators Into NIST SP 800-63B

April 22, 2024
Author(s)
Ryan Galluzzo, Andrew Regenscheid, David Temoshok, Connie LaSalle
This supplement to NIST Special Publication 800-63B, Authentication and Lifecycle Management, provides agencies with additional guidance on the use of authenticators that may be synced between devices.

Quantum Scattering of Icosahedron Fullerene C_60} with Noble-Gas Atoms

April 22, 2024
Author(s)
Eite Tiesinga, Jacek Klos, Svetlana Kotochigova
There exist multiple ways to cool neutral molecules. A front runner is the technique of buffer gas cooling, where momentum-changing collisions with abundant cold noble-gas atoms cool the molecules. This approach can, in principle, produce the most diverse

Towards the development of standards and performance metrics for 3D imaging systems

April 22, 2024
Author(s)
Prem Rachakonda, Kamel S. Saidi, Marek Franaszek, Helen Qiao, John Sweetser, Armin Khatoonabadi, David Dechow, Wesley Rhodes
NIST is leading and supporting multiple efforts to develop standards for 3D imaging systems for manufacturing automation applications. Many manufacturers specify the performance of their sensors in non-standard ways and offer no method to verify those

Benford's law in atomic spectra and opacity databases

April 21, 2024
Author(s)
Yuri Ralchenko, Jean-Christophe Pain
The intriguing law of anomalous numbers, also named Benford's law, states that the significant digits of data follow a logarithmic distribution favoring the smallest values. In this work, we test the compliance with this law of the atomic databases

Activity standard and calibrations for 227Th with ingrowing progeny

April 20, 2024
Author(s)
Denis E. Bergeron, Jeffrey T. Cessna, Brittany Broder, Leticia Pibida, Ryan P. Fitzgerald, Morgan DiGiorgio, Elisa Napoli, Brian E. Zimmerman
Thorium-227 was separated from its progeny and standardized for activity by the triple-to-double coincidence ratio (TDCR) method of liquid scintillation counting. Confirmatory liquid scintillation-based measurements were made using efficiency tracing with
Displaying 1151 - 1175 of 143606