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Search Publications

NIST Authors in Bold

Displaying 1076 - 1100 of 1728

Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles

February 1, 2004
Author(s)
N G. Armstrong, W Kalceff, James Cline, John E. Bonevich
A single and self-contained method for determining the crystallite-size distribution and shape from experimental line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional form for

Damage Modes in Dental Crown Multilayer Structures

February 1, 2004
Author(s)
Yu Zhang, Y N. Deng, Brian R. Lawn
The full potential of esthetic ceramic-based dental restorations has not yet been realized. Processing and surgical induced damage, exacerbated by fatigue damage during normal chewing, can reduce the initial strength of inherently brittle materials. The

Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers

February 1, 2004
Author(s)
R W. Cheary, A A. Coelho, James Cline
The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam

High Throughput Measurement of the Elastic Modulus of Polymer Thin Films

February 1, 2004
Author(s)
Christopher M. Stafford, A Chiche, D Julthongpiput, Michael J. Fasolka
Combinatorial and High Throughput (C&HT) methods combine clever experiment design, instrument automation, and computing tools to form a new paradigm for scientific research. Given this premise, the C&HT concept is being adapted to study problems in

High-Frequency Dielectric Relaxation in Trehalose-Glycerol Mixtures

February 1, 2004
Author(s)
O Anopchenko, Jan Obrzut, Bert W. Rust
Broadband dielectric measurements were performed on a series of trehalose-glycerol mixtures in a wide concentration range of glycerol and temperature swept from 220 K to 350 K. Relaxation spectra were obtained directly from the measured dielectric spectra

Investigations of Electrospray Sample Deposition for Polymer MALDI Mass Spectrometry

February 1, 2004
Author(s)
S D. Hanton, I Z. Hyder, J R. Stets, K G. Owens, William R. Blair, Charles M. Guttman, Anthony A. Giuseppetti
In the interest of more thoroughly understanding the relationship between sample preparation technique and spectra quality produced in Matrix-Assisted Laser Desorption/Ionization (MALDI) mass spectrometry, we have investigated details of the Electrospray

Quantitative Response Measurement of Cell Substrate Interactions via RT-PCR

February 1, 2004
Author(s)
Matthew Becker, L A. Bailey, Karen L. Wooley, J Kohn, Eric J. Amis, N Washburn
High-throughput metrologies for the rapid and systematic evaluation of synthetic materials, which would elucidate a candidate s potential biocompatibility, are needed. New synthetic methodologies have enabled a remarkable advance in the rational design of

Significant Parameters in the Optimization of MALDI-TOF-MS

February 1, 2004
Author(s)
S Wetzel, Kathleen M. Flynn, James J. Filliben
One of the most significant issues in any analytical technique is optimization. Optimization and calibration are key factors in quantitation. In matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS), one of the

Soft X-Ray Absorption Spectroscopic Study of a LiNi 0.5 Mn 0.5 O 2 Cathode During Charge

February 1, 2004
Author(s)
W S. Yoon, Mahalingam Balasubramanian, Xiao-Qing Yang, Ziwen Fu, Daniel A. Fischer, James McBreen
Soft X-ray (200 eV to 1000 eV) absorption spectroscopy (XAS) at the O K-edge and the metal L II, III-edges, in both the fluorescence yield (FY) and the partial electron yield (PEY) mode, has been used to probe the electronic structure of electrochemically

Strength of Silicon Containing Nanoscale Flaws

February 1, 2004
Author(s)
Antonia Pajares, Michael Chumakov, Brian R. Lawn
A study was made of the strength of highly polished silicon surfaces after nanoindentation with a Berkovich diamond. Strengths of the indented surfaces were measured as a function of flaw size, quantified by indenter penetration. Analogous data from etched

Bayesian Analysis of Ceria Nanoparticles From Line Profile Data

January 12, 2004
Author(s)
N G. Armstrong, A Dowd, James Cline, W Kalceff
A Bayesian/Maximum entropy (MaxEnt) method is applied to quantify the broadening of X-ray line profiles in terms of the nanocrystallite size effects in ceria. The analysis is in general agreement with transmission electron microscopy results, while

Combined NMR and XAS Study on Local Environments and Electronic Structures of the Electrochemically Li-Ion Deintercalated Li1-xCo1/3Ni1/3Mn1/302 Electrode System

January 1, 2004
Author(s)
W S. Yoon, C P. Grey, Mahalingam Balasubramanian, Xiao-Qing Yang, Daniel A. Fischer, James McBreen
Combined 6Li MAS NMR, in-situ metal K-edge (hard) XAS, and O K-edge (soft) XAS have been carried out during the first charging process for the layered Li1-xCo1/3Ni1/3Mn1/3O2 cathode material. The 6Li MAS NMR results showed the prescence of Li in the Ni2+
Displaying 1076 - 1100 of 1728
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