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Bayesian Analysis of Ceria Nanoparticles From Line Profile Data

Published

Author(s)

N G. Armstrong, A Dowd, James Cline, W Kalceff

Abstract

A Bayesian/Maximum entropy (MaxEnt) method is applied to quantify the broadening of X-ray line profiles in terms of the nanocrystallite size effects in ceria. The analysis is in general agreement with transmission electron microscopy results, while demonstrating the importance of appropriate a priori information needed in the method. The analysis also identifies other microstructural effects, such as the presence of dislocations and shape anisotropic effects, which may be influencing the size distributions determined from the Bayesian/MaxEnt method.
Proceedings Title
Proceedings| 52nd| Advances in X-Ray Analysis
Volume
48
Conference Dates
August 1-6, 2004
Conference Location
Undefined
Conference Title
Proceedings of the 52nd Annual Denver X-Ray Conference

Keywords

Bayesian statistics, crystallite size, line broadening, maximum entropy, microstructure analysis, x-ray diffraction

Citation

Armstrong, N. , Dowd, A. , Cline, J. and Kalceff, W. (2004), Bayesian Analysis of Ceria Nanoparticles From Line Profile Data, Proceedings| 52nd| Advances in X-Ray Analysis, Undefined (Accessed May 30, 2024)

Issues

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Created January 11, 2004, Updated October 12, 2021