Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 101 - 125 of 3117

Optimal Series Resistors for On-Wafer Calibrations

November 8, 2019
Author(s)
Jasper A. Drisko, Richard A. Chamberlin, James C. Booth, Nathan D. Orloff, Christian J. Long
The series resistor is a common on-wafer device typically used in the series-resistor calibration and for estimating the capacitance per unit length of coplanar waveguide transmission lines. While much work has been done using series resistors, this paper

Embedding a Rydberg Atom-Based Sensor into an Antenna for Phase and Amplitude Detection of Radio Frequency Fields and Modulated Signals

October 22, 2019
Author(s)
Christopher L. Holloway, Matthew T. Simons, Abdulaziz H. Haddab, Joshua A. Gordon, David R. Novotny
We demonstrate a Rydberg atom-based sensor embedded in a parallel-plate waveguide (PPWG) for amplitude and phase detection of a radio-frequency (RF) electric field. This embedded atomic sensor is also capable of receiving modulated communications signals

Nanobolometer with ultralow noise equivalent power

October 11, 2019
Author(s)
Roope J. Kokkoniemi, Joonas Govenius, Visa Vesterinen, Russell Lake, A M. Gunyho, K-Y Tan, S Simbierowicz, Leif Gronberg, J Lehtinen, M Prunnila, Juha Hassel, Antti Lamminen, O P. Saira, Mikko Mottonen
Since the introduction of bolometers more than a century ago, they have been used in various applications ranging from chemical sensors, consumer electronics, and security to particle physics and astronomy. However, faster bolometers with lower noise are

Design of an intelligent PYTHON code to run coupled and license-free finite-element and statistical analysis software for calibration of near-field scanning microwave microscopes

October 2, 2019
Author(s)
Jeffrey T. Fong, N. Alan Heckert, James Filliben, Pedro V. Marcal, Samuel Berweger, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
To calibrate near-field scanning microwave microscopes (NSMM) for defect detection and characterization in semiconductors, it is common to develop a parametric finite element analysis (FEA) code to guide the microscope user on how to optimize the settings

Comparison of Multiple Methods for Obtaining PO Resistances with Low Uncertainties

September 3, 2019
Author(s)
Kwang Min Yu, Dean G. Jarrett, Albert Rigosi, Shamith Payagala, Marlin E. Kraft
Capabilities for high resistance determinations are essential for calibration of currents below 1 pA, as typically requested in several applications, including semiconductor device characterization, single electron transport, and ion beam technologies

Detecting and Receiving Phase-Modulated Signals With a Rydberg Atom-Based Receiver

September 2, 2019
Author(s)
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon, David R. Novotny
Recently, we introduced a Rydberg-atom based mixer capable of detecting and measuring of the phase of a radio-frequency field through the electromagnetically induced transparency (EIT) and Autler-Townes (AT) effect. The ability to measure phase with this

Machine Learning in a Quality Managed RF Measurement Workflow

July 6, 2019
Author(s)
Aric Sanders, John Bass, Arpita Bhutani, Mary A. Ho, Jim Booth
Advances in artificial intelligence, or more specifically machine learning, have made it possible for computers to recognize patterns as well or better than humans. The process of quality management in radio-frequency measurements is an arduous one that

Electric Field Gradient Reference Material for Scanning Probe Microscopy

March 31, 2019
Author(s)
Joseph Kopanski, Lin You
Any eSPM measurement of a spatially varying electric field at the surface of a sample has a large uncertainty due to the unknown details of the tip shape near the surface. We have designed an electric field gradient reference sample to provide an

A Rydberg Atom-Based Mixer: Measuring the Phase of a Radio Frequency Wave

March 18, 2019
Author(s)
Christopher L. Holloway, Matthew T. Simons, Abdulaziz H. Haddab, Joshua A. Gordon
Rydberg atoms have been shown to be very useful in performing absolute measurements of the magnitude of a radio frequency (RF) field using electromagnetically-induced transparency (EIT). However, there has been less success in using Rydberg atoms for the
Displaying 101 - 125 of 3117
Was this page helpful?