Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Optimal Series Resistors for On-Wafer Calibrations

Published

Author(s)

Jasper A. Drisko, Richard A. Chamberlin, James C. Booth, Nathan D. Orloff, Christian J. Long

Abstract

The series resistor is a common on-wafer device typically used in the series-resistor calibration and for estimating the capacitance per unit length of coplanar waveguide transmission lines. While much work has been done using series resistors, this paper addresses the design of the resistor itself, considering both its dc resistance value and geometry, and evaluates which resistor is the best resistor. We fabricated 48 different series resistors with dc resistances ranging from approximately 1 Ω to over 6 kΩ and tested their utility in the series-resistor calibration and in extracting the capacitance per unit length of coplanar waveguide transmission lines. We found that a dc resistance near 100 Ω produces the best series-resistor calibration when compared to multiline thru-reflect-line. For extracting the capacitance per unit length, resistors with a dc resistance near 150 Ω and shorter than 20 µm long gave the capacitance values with the lowest uncertainty. Additionally, we provide some guidance on choosing frequency bounds for the capacitance estimation. These results are of interest to anyone who performs on-wafer calibrations.
Citation
IEEE Transactions on Microwave Theory and Techniques

Citation

Drisko, J. , Chamberlin, R. , Booth, J. , Orloff, N. and Long, C. (2019), Optimal Series Resistors for On-Wafer Calibrations, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2019.2944600 (Accessed October 5, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 7, 2019, Updated October 15, 2020