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Displaying 826 - 850 of 853

A statistical model for cladding diameter of optical fibres

April 1, 2003
Author(s)
C. M. Wang, Timothy J. Drapela
The National Institute of Standards and Technology has developed a contact micrometer for accurate measurement of the outer diameter of optical fibres. The contact micrometer is used to measure reference fibres that are artefacts used by the

Preface to Cavity-Enhanced Spectroscopies

December 1, 2002
Author(s)
Roger D. van Zee, J P. Looney
This submission is an introduction to Cavity-Enhanced Spectroscopy, a book which is to be published by Academic Press.

Ex-situ Characterization of InGaAsP

November 11, 2002
Author(s)
Alexana Roshko, Kristine A. Bertness
An interlaboratory comparison was undertaken to assess differences in X-ray and photoluminescence measurements from different laboratories. Six InGaAsP specimens, with nominal photoluminescence peak wavelengths of 1.1, 1.3 and 1.5 υm, were measured

Four-state measurement method for polarization dependent wavelength shift

September 1, 2002
Author(s)
William C. Swann, Shellee D. Dyer, Rex M. Craig
We present a novel four-state method for measuring the polarization dependent wavelength shift (PDW) of a fiber Bragg grating. We show that measurement of the grating's wavelength for only four different polarization states is sufficient to completely

InGaAsP Ex-situ characterization

July 1, 2002
Author(s)
Alexana Roshko, Kristine A. Bertness
An interlaboratory comparison has been undertaken of X-ray and photoluminescence measurements of InGaAsP on InP. Six 1 cm 2 specimens are being measured, with nominal photoluminescence wavelengths of 1.1, 1.3 and 1.5 υm (2 of each). Preliminary maps of the

Wavelength references for 1300-nm wavelength division multiplexing

May 1, 2002
Author(s)
Tasshi Dennis, E. A. Curtis, C. W. Oates, Leo W. Hollberg, Sarah L. Gilbert
We have conducted a study of potential wavelength calibration references for use as both moderate-accuracy transfer standards and high-accuracy National Institute of Standards and Technology (NIST) internal references in the 1280-1320 nm wavelength

High-Speed, High-Efficiency. Large-Area Resonant Cavity Enhanced p-i-n Photodiodes for Multimode Fiber Communications

December 1, 2001
Author(s)
M. Gvkkavas, O. Dosunmu, M. S. {Umlat}nl{umlat}, G. Ulu, Richard Mirin, David H. Christensen, E. Vzbay
In this letter, we report AlGaAs-GaAs p-i-n photodiodes with a 3-dB bandwidth in excess of 10 GHz for devices as large as 60-υm diameter. Resonant cavity enhanced photodetection is employed to improve quantum efficiency, resulting in more than 90% peak

Upgrades to the NIST/DARPA EUV Reflectometry Facility

December 1, 2001
Author(s)
Charles S. Tarrio, Thomas B. Lucatorto, S Grantham, M B. Squires, Uwe Arp, Lu Deng
We have recently installed a new sample chamber at the NIST/DARPA EUV Reflectometry Facility at the National Institute of Standards and Technology. The chamber replaces a much smaller system on Beamline 7 at the Synchrotron Ultraviolet Radiation Facility

Hybrid glass substrates for waveguide device manufacture

April 15, 2001
Author(s)
Samuel D. Conzone, Joseph S. Hayden, David S. Funk, Alexana Roshko, D. L. Veasey
Hybrid glass substrates composed of active (ER/Yb co-doped) and passive phosphate glass were prepared by a novel, low temperature joining process. The resulting hybrid substrates are chemically and physically robust; they can be cut, ground and polished by

Evolution of the Shapes of InAs and InGaAs Quantum Dots

January 1, 2001
Author(s)
Richard P. Mirin, Alexana Roshko, M. van der Puijl, Andrew G. Norman
The exact shape of self-assembled quantum dots is still a controversial subject in the literature, despite the fact that this knowledge is of paramount importance for modeling the energy levels and electron wavefunctions in the quantum dots. We will

Wavelength standards for optical communications

January 1, 2001
Author(s)
Sarah L. Gilbert, William C. Swann, Tasshi Dennis
We review wavelength accuracy and calibration issues for wavelength division multiplexed (WDM) optical fiber communication and describe our work on wavelength calibration references. We have developed wavelength references for National Institute of

Compound semiconductor oxide antireflection coatings

May 15, 2000
Author(s)
K. J. Knopp, Richard Mirin, Kristine A. Bertness, Kevin L. Silverman, David H. Christensen
We report the development of high quality, broad-bandwidth, antireflection (AR) coatings using the low index provided by wet thermally oxidized Al 0.98Ga 0.02As. We address the design criteria, fabrication, and characterizations of AR coatings composed of

Vibrationally-Resolved Sum-Frequency Generation With Broad Bandwidth Infrared Pulses

October 15, 1998
Author(s)
Lee J. Richter, T Petralli-Mallow, John C. Stephenson
We present a novel procedure for vibrationally-resolved sum-frequency generation (SFG) in which a broad-bandwidth IR pulse is mixed with a narrow-bandwidth visible pulse. The resultant SFG spectrum is dispersed with a spectrograph and detected in parallel
Displaying 826 - 850 of 853
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