Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Refined treatment of single-edge diffraction effects in radiometry

Published

Author(s)

Eric L. Shirley

Abstract

This work treats diffraction corrections in radiometry for cases of point and extended sources in symmetric three-element systems. It considers diffraction effects for both spectral power and total power in cases of Planckian sources. This improves upon an earlier work by simplifying the leading terms of asymptotic series, estimating remainder terms for asymptotic expansions, accelerating the treatment of extended sources and simplifying the calculation of diffraction effects over a range of wavelengths. We demonstrate the methodology’s efficacy in two radiometric applications.
Citation
Journal of the Optical Society of America A-Optics Image Science and Vision
Volume
33
Issue
8

Keywords

asymptotic, diffraction, optical, radiometry, solar irradiance

Citation

Shirley, E. (2016), Refined treatment of single-edge diffraction effects in radiometry, Journal of the Optical Society of America A-Optics Image Science and Vision, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920348 (Accessed March 29, 2024)
Created July 14, 2016, Updated February 19, 2017