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NIST Authors in Bold

Displaying 726 - 750 of 2714

Virtual rough samples to test 3D nanometer-scale SEM stereo photogrammetry

March 22, 2016
Author(s)
John S. Villarrubia, Vipin N. Tondare, Andras Vladar
The combination of SEM for high spatial resolution, images from multiple angles to provide 3D information, and commercially available stereo photogrammetry software for 3D reconstruction offers promise for dimensional metrology in 3D. A method is described

Centroid and Orientation Precision of Localization Microscopy

March 11, 2016
Author(s)
Craig D. McGray, Craig R. Copeland, Samuel M. Stavis, Jon C. Geist
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and motion

A Review and Survey of Metrology Outreach Efforts in Post-Secondary Education

March 1, 2016
Author(s)
Georgia L. Harris, Maria Isabel Pena
The paper presents a brief history and background of metrology outreach efforts to colleges and universities. It also includes a summary of a 2015 international educational survey used in part to assess colleges and universities that have measurement

Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior

March 1, 2016
Author(s)
Marlin E. Kraft, Randolph E. Elmquist, Gert Rietveld, Jan van der Beek, Alessandro Mortara, Beat Jeckelmann
The low-ohmic resistance measurement capabilities of the Van Swinden Laboratorium, National Institute of Standards and Technology, and the Federal Office of Metrology (METAS) were compared using a set of resistors with values 100 mΩ, 10 mΩ, 1 mΩ, and 100

Method Validation and Standards in Hydrogen/Deuterium Exchange Mass Spectrometry

March 1, 2016
Author(s)
Jeffrey W. Hudgens, Richard Y. Huang, Emma D'Ambro
The chapter examines method validation and measurement standards for measuring protein dynamics by hydrogen/deuterium exchange mass spectrometry. Topics examined include the rationale for a reference measurement system for HDX-MS, attaining high accuracy

Optimization of Registration Performance Metrics

February 25, 2016
Author(s)
Marek Franaszek, Geraldine Cheok
Perception systems are a very important component of automation and robotics. These systems localize objects in its local coordinate frame and the data has to be available for use in another coordinate frame. This requires that the data be transformed from

Coil motion effects in watt balances: a theoretical check

February 10, 2016
Author(s)
Stephan Schlamminger, Shisong Li, Darine El Haddad, Frank C. Seifert, Leon S. Chao, Jon R. Pratt
A watt balance is a precision apparatus for the measurement of the Planck constant that has been proposed as a primary method for realizing the unit of mass in a revised International System of Units. In contrast to an ampere balance, which was

Reference Module in Materials Science and Materials Engineering MATS 01908

February 1, 2016
Author(s)
Randolph E. Elmquist, Anthony Hartland
The cryogenic current comparator is used to maintain national representations of the ohm based on the quantized Hall resistance standard. The measurement technique utilizes the Meissner effect to establish accurate resistance ratios with specialized

Recent approaches for bridging the pressure gap in photoelectron microspectroscopy

January 29, 2016
Author(s)
Andrei A. Kolmakov, Luca Gregoratti, Maya Kiskinova, Sebastian Gunther
Ambient pressure photoelectron spectroscopy (APPES) and microscopy are at the frontier of modern chemical analysis at liquid-gas, solid-liquid and solid-gas interfaces, bridging science and engineering of functional materials. Complementing the current

Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit

January 25, 2016
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Ryan Goldband
Sidewall sensing in CD-AFMs usually involves continuous lateral dithering of the tip or the use of a control algorithm and fast response piezo actuator to position the tip in a manner that resembles touch-triggering of coordinate measuring machine (CMM)

Experimental demonstration of deep frequency modulation interferometry

January 21, 2016
Author(s)
Katharina-Sofie Isleif, Oliver Gerberding, Thomas Schwarze, Moritz Mehmet, Gerhard Heinzel, Felipe Guzman
Experiments for space and ground-based gravitational wave detectors often require large dynamic range interferometric position readout of test masses with 1 pm/√Hz precision over long time scales. Heterodyne interferometer schemes that achieve such

A Rational Foundation for Software Metrology

January 20, 2016
Author(s)
David W. Flater, Paul E. Black, Elizabeth N. Fong, Raghu N. Kacker, Vadim Okun, Stephen S. Wood, David R. Kuhn
Much software research and practice involves ostensible measurements of software, yet little progress has been made on an SI-like metrological foundation for those measurements since the work of Gray, Hogan, et al. in 1996-2001. Given a physical object

Measurement Challenges and Metrology for Monitoring CO2 Emissions from Smokestacks Workshop Summary

January 20, 2016
Author(s)
Aaron N. Johnson, Rodney A. Bryant, Tamae M. Wong, James R. Whetstone, Eric Harman, Woong Kang, Keith A. Gillis, Hsin-Hung Lee, Iosif I. Shinder, Liang Zhang
On April 20-21, 2015, NIST hosted a workshop that, through measurement science, enabled the owners of stationary sources (primarily the electric power industry) and their regulatory agencies (federal and state) to better characterize greenhouse gas (GHG)
Displaying 726 - 750 of 2714
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