Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author

Advanced search

Title

Author

NIST Pub Series

NIST Topic Areas

Report Number

Publication Date

NIST Authors in Bold

Displaying 64051 - 64075 of 74372

Process Reasoning

January 1, 1987

Author(s)

Steven R. Ray

With the increasing levels of automation in factories, production management systems need increasingly sophisticated models of manufacturing processes. A framework is presented for the design and implementation of process reasoning modules which

Programming languages for knowledge-based systems:

January 1, 1987

Author(s)

John V Cuginia

Properties and interactions of oral structures and restorative materials:

January 1, 1987

Author(s)

J Tesk, J Antonucci, G Brauer, J McKinney, R Penn, J Stansbury, W de Rijk, S Venz, H Iizuka, S Lee, K Asaoka

Properties and interactions of oral structures and restorative materials:

January 1, 1987

Author(s)

J Tesk, J Antonucci, G Brauer, J McKinney, R Penn, J Stansbury, W de Rijk, S Venz, H Iizuka, S Lee, K Asaoka

Publications of the National Bureau of Standards 1986 Catalog:

January 1, 1987

Author(s)

Rebecca J Pardee

RADCNBS international workshop moisture measurement and control for microelectronics (IV) ::proceedings of the RADCNBS workshop held at the National Bureau of Standards Gaithersburg, MD November 12-14, 1986

January 1, 1987

Author(s)

Didier Kane, Benjamin A Moore, W Janes Walters

Radiance temperature calibrations:

January 1, 1987

Author(s)

William R Waters, James H Walker, Albert T Hattenburg

Radioactivity calibrations with the "4IEU" Gamma ionization chamber and other radioactivity calibration capabilities:

January 1, 1987

Author(s)

Jacqueline M Calhoun

Radiometric standards in the vacuum ultraviolet:

January 1, 1987

Author(s)

Jules Z Klose, J Melvin Bridges, William R Ott

Recommended instrumentation approaches for a shared-memory multiprocessor:

January 1, 1987

Author(s)

George Nacht, Alan Mink

Reference standard polyethylene resins and piping materials ::final report (October 1, 1985 - September 30, 1986)

January 1, 1987

Author(s)

J M Crissman, F W Wang, C M Guttman, J R Maurey, H L Wagner, B M Fanconi, D L VanderHart

Regular spectral transmittance:

January 1, 1987

Author(s)

Kenneth L Eckerle, Jack J Hsia, Klaus D Mielenz, Victor R Weidner

Report of the 72nd National Conference on on Weights and Measures 1987:

January 1, 1987

Author(s)

Albert D Tholen, Carroll S Brickenkamp, Ann P Heffernan

Report on the NBS software acceptance test workshop April 1-2, 1986:

January 1, 1987

Author(s)

Dolores R Wallace, John C Cherniavsky

Requirements for the calibration of mechanical shock transducers:

January 1, 1987

Author(s)

D C Robinson

Research for electric energy systems - an annual report:

January 1, 1987

Author(s)

R E Hebner

Results of the Monte Carlo calculation of one- and two-dimensional distributions of particles and damage:

January 1, 1987

Author(s)

John Albers

Review of needs for thermophysical property data on solid feedstocks II. Oil shale:

January 1, 1987

Author(s)

Jane E Callahan

SASE - Standards Analysis, Synthesis, and Expression program ::user manual

January 1, 1987

Author(s)

Steven J Fenves, May T Slava, James P Barnett

Scanning Electron Microscope with Polarization Analysis Studies of Magnetic Materials

January 1, 1987

Author(s)

John Unguris, G Hembree, Robert Celotta, Daniel T. Pierce

Scanning Electron Microscopy with Polarization Analysis: High Resolution Images of Magnetic Microstructure

January 1, 1987

Author(s)

G Hembree, John Unguris, Robert Celotta, Daniel T. Pierce

Secondary electrons from a ferromagnet exhibit a spin polarization related to the net spin density of the valence electrons, i.e., directly proportional to the magnetization. Thus, secondary electron polarization analysis provides a direct measurement of