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Displaying 62576 - 62600 of 74337

Mapping Processes to Processors for Space Based Robot Systems

August 25, 1989

Author(s)

Thomas E. Wheatley

NASA

Improved Low-Level Silicon Avalanche Photodiode Transfer Standards at 1064 Micrometers

August 22, 1989

Author(s)

A. L. Rasmussen, A. A. Sanders, Philip A. Simpson

Collision electron detachment and decomposition cross sections for SF-6, SF-5, and F- on SF6 and rare gas targets

August 15, 1989

Author(s)

Yicheng Wang, R. Champion, L. D. Doverspike, James K. Olthoff, Richard J. VanBrunt

Collisional electron detachment and decomposition cross sections for SF6-, SF5-, and F- on SF6 and rare gas targets

August 15, 1989

Author(s)

Yicheng Wang, R. Champion, L. D. Doverspike, James K. Olthoff, Richard J. Van Brunt

Collisional Electron detachment and decomposition rates of SF-6, SF-5, and F- in SF6: Implications for ion transport and electrical discharges

August 15, 1989

Author(s)

Yicheng Wang, R. Champion, L. D. Doverspike, James K. Olthoff, Richard J. Van Brunt

A comparison of far-field methods for determining mode field diameter of single-mode fibers using both gaussian and petermann definitions

August 1, 1989

Author(s)

Timothy J. Drapela, Douglas L. Franzen, A. H. Cherin, R P. Smith

Abstract-An interlaboratory comparison of far-field measurement methods to determine mode field diameter of single-mode fibers was conducted among members of the Electronic Industries Association. Measurements were made on dispersion unshifted and shifted

A Detailed Description of the Knowledge-Based System for Physical Database Design (2 volumes)

August 1, 1989

Author(s)

Christopher E. Dabrowski

A Generic Architecture for Computer Integrated Manufacturing Software Based on the Product Data Exchange Specification

August 1, 1989

Author(s)

James E. Fowler

The Product Data Exchange Specification (PDES) is an emerging standard that is intended to address the problems of data exchange and representation for a variety of manufacturing enterprises. The National Institute of Standards and Technology (NIST) has a

An Iterative Technique to Correct Probe Position Errors in Planar Near-Field to Far-Field Transformations

August 1, 1989

Author(s)

Lorant A. Muth, R L. Lewis

Calibrating Network Analyzers with Imperfect Test Ports

August 1, 1989

Author(s)

John R. Juroshek, C. A. Hoer, Raian K. Kaiser

Computer Viruses and Related Threats: A Management Guide

August 1, 1989

Author(s)

John P. Wack, Lisa J. Carnahan

This document provides guidance for technical managers for the reduction of risk to their computer systems and networks from attack by computer viruses, unauthorized users, and related threats. The guidance discusses the combined use of policies

EVSIM: An Evaporator Simulation Model Accounting for Refrigerant and One Dimensional Air Distribution (NISTIR 89-4133)

August 1, 1989

Author(s)

Piotr A. Domanski

The report describes a computer model, EVSIM, of a refrigerant-to-air heat exchanger of the type used in residential air conditioning as an evaporator. The model provides performance predictions of a one-slab or two-slab evaporator for a given refrigerant

Government Open Systems Interconnection Users' Guide

August 1, 1989

Author(s)

Frederick E. Boland Jr.

Magnetization of Imperfect Superconducting Grains

August 1, 1989

Author(s)

R. L. Peterson

Offset Criterion for Determining Superconductor Critical Current

August 1, 1989

Author(s)

John (Jack) W. Ekin, John W. West

OSINET General Agreements and Information Document

August 1, 1989

Author(s)

Gerard F. Mulvenna

Processing Rate Sensitivities of a Heterogeneous Multiprocessor

August 1, 1989

Author(s)

Gordon E. Lyon

Standards and High Speed Instrumentation

August 1, 1989

Author(s)

Clark A. Hamilton, Donald G. McDonald, J. E. Sauvageau, S. Whiteley

Subambient Temperature Modification of Selectivity in Reversed-Phase Liquid Chromatography

August 1, 1989

Author(s)

Lane C. Sander, Stephen A. Wise

TEM/Reverberating Chamber Design/Concept Study: A Single Facility for Large System Radiated EMC Testing, 10 kHz-40 GHz?

August 1, 1989

Author(s)

M. L. Crawford

Transfer function analysis of measured transfer matrices

August 1, 1989

Author(s)

Shao Yang, Igor Vayshenker, A. R. Mickelson

Measurements of mode transfer matrices of various multimode fiber optic connectors are presented. To analyze the accuracy and repeatability of such measurements, a theoretical framework which employs mode transmission functions is derived. It is shown that

Trial of Open System Interconnection (OSI) Protocols Over Integrated Services Digital Network (ISDN)

August 1, 1989

Author(s)

C A. Edgar

Robot Crane Technology (Final Report)

July 31, 1989

Author(s)

Nicholas Dagalakis, James S. Albus, Kenneth R. Goodwin, Jonathan W. Lee, T M. Tsai, et al

Integrity Tests for High-Tc and conventional critical-current measurement systems

July 28, 1989

Author(s)

Loren F. Goodrich, S L. Bray

Critical-current measurement systems must be extremely sensitive to the small differential voltage that is present across the test specimen as it changes from zero resistance state to the flux-flow resistance state. Consequently, these measurement systems

Comments on a paper by Richardson and De Jonghe

July 17, 1989

Author(s)

George G. Harman

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