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Displaying 61976 - 62000 of 74242

High Tc superconductors and critical current measurement*

January 17, 1990
Author(s)
Loren F. Goodrich, S L. Bray
With the introduction of high Tc superconductors, a number of problems associated with critical current, Ic, measurement have arisen. THe existing Ic measurement practices were developed and proved for low Tc superconductors. There are substantial

AI in Manufacturing: The NBS AMRF as an Intelligent Machine

January 2, 1990
Author(s)
Dennis A. Swyt
Within its Automated Manufacturing Research Facility (AMRF), the U.S. National Bureau of Standards (NBS) is addressing research issues in interface standards for the fully automated factory of the future for the production of small batches of discrete

180deg Surface Domain Wall Magnetization Profiles: Comparisons Between Scanning Electron Microscopy with Polarization Analysis Measurements, Magneto-Optic Kerr Microscopy Measurements and Micromagnetic Models

January 1, 1990
Author(s)
M Scheinfein, P J. Ryan, john unguris, Daniel T. Pierce, Robert Celotta
We compare measurements of magnetization profiles across a 180° surface domain wall in a 0.24-υm-thick of Permalloy (Ni 81Fe 19), obtained with scanning electron microscopy with polarization analysis (SEMPA) and longitudinal magneto-optic (MO) Magneto
Displaying 61976 - 62000 of 74242
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