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Displaying 58251 - 58275 of 74221

Microform Calibrations in Surface Metrology

January 1, 1994
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the profile

Morphological Estimation of Tip Geometry for Scanned Probe Microscopy

January 1, 1994
Author(s)
John S. Villarrubia
Morphological constraints inherent in the imaging process limit the possible shapes of the tip with which any given tunneling microscope or atomic force microscope image could have been taken. Broad tips do not produce narrow image protrusions. Therefore
Displaying 58251 - 58275 of 74221
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