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Displaying 58076 - 58100 of 74505

On-Wafer Impedance Measurement on Lossy Substrates

June 1, 1994
Author(s)
Dylan F. Williams, Roger Marks
This paper introduces a new method for measuring impedance parameters in transmission lines fabricated on lossy or dispersive dielectrics. The method, which uses an independent calibration to provide an impedance reference, compares well with conventional

Report of the NIST Workshop on Key Escrow Encryption

June 1, 1994
Author(s)
A Oldehoeft, Dennis K. Branstad
On June 10, 1994, the National Institute of Standards and Technology (NIST) hosted a one-day workshop to present and discuss key escrow encryption technology, including the recently-approved Escrowed Encryption Standard (EES), Federal Information

Problems and progress in the measurement of reference mass spectra

May 29, 1994
Author(s)
C L. Clifton, Anzor Mikaia, Stephen Stein
Compounds of interest and their availability as well as purity of the samples in the market are discussed. Difficulties in acquiring samples of common chemicals are noted. Sample preparation procedures for GC-MS analysis along with the instrumental
Displaying 58076 - 58100 of 74505
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