Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer

Published

Author(s)

J R. Lowney, W. R. Thurber, David G. Seiler
Citation
Applied Physics Letters
Volume
64
Issue
22

Citation

Lowney, J. , Thurber, W. and Seiler, D. (1994), Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer, Applied Physics Letters (Accessed May 29, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 29, 1994, Updated October 12, 2021