Lowney, J.
, Thurber, W.
and Seiler, D.
(1994),
Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer, Applied Physics Letters
(Accessed October 9, 2024)
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Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer
Published
Author(s)
, ,
Citation
Applied Physics Letters
Volume
64
Issue
22
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 29, 1994, Updated October 12, 2021