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Displaying 57976 - 58000 of 74219

A New Method to Measure the Distance Between Graduation Lines on Graduated Scales

January 1, 1994
Author(s)
William B. Penzes, Robert Allen, Michael W. Cresswell, L Linholm, E C. Teague
Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small graduated glass scale for the calibration of optical instruments such as microscopes. However, stage micrometers are generally not

A Novel CMM Interim Testing Artifact

January 1, 1994
Author(s)
Steven D. Phillips, Bruce R. Borchardt, Gregory W. Caskey, David E. Ward, Bryon S. Faust, Daniel S. Sawyer
NIST is currently developing equipment and techniques to rapidly access the performance of Coordinate Measuring machines (CMMs). This will allow the frequent testing of CMMs to insure that they measure parts accurately. A novel interim testing artifact

A Study of the Surface Texture of Polycrystalline Phosphor Films Using AFM

January 1, 1994
Author(s)
Zsolt R?vay, J Schneir, D Brower, John S. Villarrubia, Joseph Fu, et al
Stimulable phosphor thin films are being investigated for use as optical data storage media. We have successfully applied atomic force microscopy (AFM) to the measurement of the surface texture of these films. Determination of the surface texture of the

Air Change Effectiveness Measurements in Two Modern Office Buildings

January 1, 1994
Author(s)
Andrew K. Persily, William S. Dols, Steven J. Nabinger
Local age of air and air change effectiveness were determined in two office buildings using tracer gas techniques to study the applicability of the associated measurement procedures in mechanically ventilated office buildings. Measurement issues examined
Displaying 57976 - 58000 of 74219
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