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Displaying 57926 - 57950 of 74189

A Dimensional Inspection Planning Activity Model

January 1, 1994
Author(s)
Shaw C. Feng
This paper describes an activity model for dimensional inspection planning that bridges the gap between product design and the dimensional measurement of manufactured products. Functionally, this model specifies requirements for developing a part of a

A High Accuracy Micrometer for Diameter Measurements of Cylindrical Standards

January 1, 1994
Author(s)
John R. Stoup, Theodore D. Doiron
NIST has developed a new instrument to measure cylindrical standards including thread wires and plain plug gages. The instrument uses a laser interferometer system which is coupled with an air bearing linear motion slide and precise contact geometry to

A New Method to Measure the Distance Between Graduation Lines on Graduated Scales

January 1, 1994
Author(s)
William B. Penzes, Robert Allen, Michael W. Cresswell, L Linholm, E C. Teague
Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small graduated glass scale for the calibration of optical instruments such as microscopes. However, stage micrometers are generally not

A Novel CMM Interim Testing Artifact

January 1, 1994
Author(s)
Steven D. Phillips, Bruce R. Borchardt, Gregory W. Caskey, David E. Ward, Bryon S. Faust, Daniel S. Sawyer
NIST is currently developing equipment and techniques to rapidly access the performance of Coordinate Measuring machines (CMMs). This will allow the frequent testing of CMMs to insure that they measure parts accurately. A novel interim testing artifact
Displaying 57926 - 57950 of 74189
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