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Displaying 57251 - 57275 of 74214

Progress in Tip Modeling

January 1, 1995
Author(s)
John S. Villarrubia
Progress since the last Industrial Applications of Scanned Probe Microscopy workshop in the estimation of tip geometries for scanned probe microscopes is discussed. A new method which does not require calibration of the tip characterizers has been
Displaying 57251 - 57275 of 74214
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