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Displaying 57151 - 57175 of 74179

Overview of the EBIT Program at NIST

January 1, 1995
Author(s)
John D. Gillaspy, Y Aglitskiy, E W. Bell, C M. Brown, Christopher T. Chantler, R Deslattes, Uri Feldman, Lawrence T. Hudson, J M. Laming, E S. Meyer, C A. Morgan, A I. Pikin, J R. Roberts, L P. Ratliff, F. G. Serpa, J Sugar, E Takacs

Overview of the Manufacturing Engineering Toolkit Prototype

January 1, 1995
Author(s)
Michael Iuliano
Many different types of manufacturing software applications have become available in recent years. These applications focus on specific engineering functions of the overall product life cycle. A problem facing industry is that these applications are not

Performance Evaluations

January 1, 1995
Author(s)
Steven D. Phillips
The subject of coordinate measuring machine (CMM) evaluation is a broad an multifaceted one. The theme of this chapter is the evaluation of CMM measurement uncertainty which is central to the concept of traceability. This chapter elucidates the sources of
Displaying 57151 - 57175 of 74179
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