U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 57101 - 57125 of 74207

Magnetoresistance Values Exceeding 21 Percent in Symmetric Spin Valves

January 1, 1995
Author(s)
William F. Egelhoff Jr., T Ha, R Misra, Y Kadmon, J Nir, Cedric J. Powell, Mark Stiles, Robert McMichael, C Lin, J Sivertsen, J Judy, K Takano, A Berkowitz, T Anthony, J Brug
We report values of the giant magnetoresistance (GMR) effect exceeding 21% in symmetric spin valves, the highest values ever reported for such structures. The key elements in this achievement are the use of a Co/Cu/Co/Cu/Co multilayer in which the center

Manufacturing Features Instances: Which ones to Recognize?

January 1, 1995
Author(s)
William Regli, Satyandra K. Gupta, D Nau
Manufacturing features and feature-based representations have become an integral part of research on manufacturing systems, largely due to their ability to model correspondences between design information and manufacturing operations. However, several

Manufacturing-Operation Planning Versus AI Planning

January 1, 1995
Author(s)
D Nau, Satyandra K. Gupta, William Regli
Athough AI planning techniques can potentially be useful in several manufacturing domains, this potential remains largely unrealized. Many of the issues important to manufacturing engineers have not seemed interesting to AI researchers-but in order to

Measurement and Analysis of Forces in Grinding of Silicon Nitride

January 1, 1995
Author(s)
S Jahanmir, T W. Hwang, Eric P. Whitenton, S Job, Christopher J. Evans
Using an instrumented surface grinder, the two components of grinding forces (normal and tangential) were measured for different types of silicon nitride ceramics. The influences of grinding parameters, such as down feed and table speed, and grinding

Measurement of Patterned Film Linewidth for Interconnect Characterization

January 1, 1995
Author(s)
L Linholm, Robert Allen, Michael W. Cresswell, Rathindra Ghoshtagore, S Mayo, H Schafft, John A. Kramar
The results from high-quality electrical and physical measurements on the same cross-bridge resistor test structure with approximately vertical sidewalls have shown differences in linewidth as great as 90 nm for selected conductive films. These differences

Measuring Long Gage Blocks with the NIST Line Scale Interferometer

January 1, 1995
Author(s)
John S. Beers
An improved method for temporarily converting long gage blocks into line scales is described. The new process employs fused silica rather than previously used steel conversion gage blocks. Conversion blocks are pairs of small (13 mm) gage blocks with
Displaying 57101 - 57125 of 74207
Was this page helpful?