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Displaying 57026 - 57050 of 74461

Microform Calibrations in Surface Metrology

February 1, 1995
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the profile

The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs

February 1, 1995
Author(s)
Steven D. Phillips, Bruce R. Borchardt, William T. Estler
This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point sampling

A Coaxial-Resonator Driven rf(Paul)-Trap for Strong Confinement

January 1, 1995
Author(s)
Steven R. Jefferts, C Monroe, E W. Bell, David J. Wineland
We describe a variant of the quadrupole rf (Paul) ion trap capable of localization of a trapped ion to much less than an optical wavelength (Lamb-Dicke regime). The trapping potentials are generated by a high-Q, vacuum-compatible, quarter-wave resonator
Displaying 57026 - 57050 of 74461
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