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Displaying 56876 - 56900 of 74214

Automated Calibration of Scanning Probe Microscopy by Image Processing

January 1, 1995
Author(s)
J Jorgensen
The continuing drive within high technology industries to push dimensional tolerances to still smaller values motivates the use of surface measuring techniques with better resolution. This requirement can be met by the scanning probe microscopy (SPM)

Automated Manufacturability Analysis: A Survey

January 1, 1995
Author(s)
William Regli
In the marketplace of the 21st century, there is no place for traditional over-the-wall'', communications between design and manufacturing. In order to design it right the very first time, designers must ensure that their products are both functional and

Calibration Uncertainties for Microform of Rockwell Hardness Indenters

January 1, 1995
Author(s)
F Rudder, Jun-Feng Song
A microform calibration procedure has been developed at NIST to certify geometric conformity of Rockwell C hardness indenters. The interest in microform calibrations is to unify national and international comparisons of hardness tests. Using accepted

Cation Diffusion at the Polymer Coating/Metal Interface.

January 1, 1995
Author(s)
Tinh Nguyen, Z Zhang, C Lin, J M. Pommersheim
Theoretical and experimental studies were carried out on the transport of cations in the channel between a polymer coating and a metal substrate from a defect in the absence of an applied electrical potential. The model consists of two stages: an initial
Displaying 56876 - 56900 of 74214
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