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Displaying 56276 - 56300 of 74461

Novel Methods for Length Measurement Employing Diode Lasers

January 1, 1996
Author(s)
Jack A. Stone Jr., Lowell P. Howard, Alois Stejskal, M Stephens, C Oates, L Hollberg
Diode lasers have several unique capabilities for length-measurement applications, arising from properties of the diodes that are much different from those of the venerable helium-neon laser presently used for most interferometric measurements. For example

On chip morphology, tool wear and cutting mechanics in finish hard turning.

January 1, 1996
Author(s)
Matthew A. Davies, Christopher J. Evans, Y K. Chou
Topography of surfaces produced in finish hard turning using cubic boron nitride (CBN) is affected by a large number of factors including tool wear and the mechanics of the chip formation process. This paper shows first that tool wear rates are affected by

Optical Overlay Metrology at NIST

January 1, 1996
Author(s)
Richard M. Silver, Amy Singer, L Carroll, S Berg-cross, James E. Potzick
Many of the significant challenges in making accurate overlay registration measurements are discussed. An understanding of the causes of the errors affecting these measurements is a prerequisite to improving accuracy and also for the design of standard

Optimizing the GMR of Symmetric and Bottom Spin Valves

January 1, 1996
Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, Mark Stiles, Robert McMichael, C Lin, J Sivertsen, J Judy, K Takano, A Berkowitz, T Anthony, J Brug
We have attempted to optimize the values of the giant magnetoresistance in symmetric spin valves of the type NiO/Co/Cu/Co/Cu/Co/NiO (achieving 23.4%) and in bottom spin valves of the type Co/Cu/Co/NiO (achieving 17.0%), the largest values ever reported for
Displaying 56276 - 56300 of 74461
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