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Displaying 56226 - 56250 of 74175

Using a Potentiostat to Model In-Process Electromechanical Dressing

January 1, 1996
Author(s)
Robert S. Polvani, A Fraker, Christopher J. Evans
In-process electrochemical dressing insures true, sharp, stable wheels for efficient ceramic grinding. To better implement electrochemical dressing, we couple laboratory studies based on a potentiostat with shop floor grinding runs. To do this, a calomel

Wavelength-Shift Interferometry: Using a Dither to Improve Accuracy

January 1, 1996
Author(s)
Jack A. Stone Jr., Alois Stejskal, Lowell P. Howard
A dither in path length can dramatically improve the accuracy of wavelength-shift methods used for absolute distance interferometry. Here we report how a dither improves the accuracy of absolute distance measurement by two orders of magnitude, reducing

A Model of Voltage-Dependent Dieletric Losses for Ferroelectric MMIC Devices

December 31, 1995
Author(s)
J. F. Scott, J. Price, James A. Beall, Ronald H. Ono, C. A. Paz de Araujo, L. D. McMillian
The use of high-dielectric films for microwave devices, especially phased-array radar systems, in the tens of GHz regime requires very low-loss (0.01 to 0.1) films. Unfortunately most ferroelectrics have losses that diverge (greater than unity) in this
Displaying 56226 - 56250 of 74175
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