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Displaying 55851 - 55875 of 74171

Generation of Non-Classical Motional States of a Trapped Atom

January 1, 1996
Author(s)
D M. Meekhof, C Monroe, B E. King, Wayne M. Itano, David J. Wineland
We report the creation of thermal, Fock, coherent, and squeezed states of motion of a harmonically bound 9Be+ ion. The last three states are coherently prepared from an ion which has been initially laser cooled to the zero point of motion. The ion is

Growth of Giant Magnetoresistance Spin Valves Using Pb and Au as Surfactants

January 1, 1996
Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, Mark D. Stiles, Robert McMichael, C Lin, J Sivertsen, J Judy, K Takano, A Berkowitz
We have investigated the use of Pb and Au as surfactants in an attempt to achieve smoother and sharper interfaces in three types of giant magnetoresistance (GMR) spin valve multilayers: symmetric spin valves, bottom spin valves, and top spin valves. The

Growth of GMR Spin Valves using Indium as a Surfactant

January 1, 1996
Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, Mark D. Stiles, Robert McMichael
We have investigated the use of In as a surfactant to achieve smoother interfaces in spin-valve multilayers of the general type: FeMn/Ni 80Fe 20/Co/Cu/Co/Ni 80Fe 20/glass. The coupling field is reduced from 0.8 to 0.3 mT, presumably by suppressing

Heat Release Mechanisms in Inhibited Laminar Counterflow Flames (Journal)

January 1, 1996
Author(s)
Ki Y. Lee, Don J. Cha, Anthony Hamins, I K. Puri
Due to the participation of inhibitors in flame chemistry, it is difficult to concurrently characterize the complex interaction between their cooling action, and the chemical inhibition (which decrease temperature), and their contribution of heat release

Height Calibration of Atomic Force Microscopes Using Silicon Atomic Step Artifacts

January 1, 1996
Author(s)
V W. Tsai, Theodore V. Vorburger, P Sullivan, Ronald G. Dixson, Richard M. Silver, Edwin R. Williams, J Schneir
The decreasing feature dimensions required in the semiconductor manufacturing industry are placing ever increasing demands upon metrology instruments. Atomic force microscopes (AFMs), which can have 1 nm lateral resolution and sub-angstrom vertical

Hierarchical Control in a Virtual Manufacturing Facility

January 1, 1996
Author(s)
Michael Iuliano, Albert W. Jones
Researchers at the National Institute of Standards and Technology are developing a virtual manufacturing cell, which will facilitate standards development and testing. This cell will contain simulation models of a wide range of manufacturing equipment
Displaying 55851 - 55875 of 74171
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