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Displaying 55326 - 55350 of 74195

New Certified Length Scale for Microfabrication Metrology

September 1, 1996
Author(s)
James E. Potzick
The National Institute of Standards and Technology is developing a dimensional pitch standard covering the range 1 micrometers to 10 mm, intended for the calibration of microscope magnification and of dimensional metrology instrument scales. Called SRM

Ultrasonic Power Output Measurement by Pulsed Radiation Pressure

September 1, 1996
Author(s)
Steven E. Fick, Franklin R. Breckenridge
Direct measurements of time-averaged spatially integrated output power radiated into reflectionless water loads can be made with high accuracy using techniques which exploit the radiation pressure exerted by sound on all objects in its path. With an

What are Feature Interactions?

September 1, 1996
Author(s)
William Regli, Mike Pratt
Manufacturing features and their interactions have become areas of research scrutiny in recent years. It is widely accepted that intelligent reasoning about interactions among features is a critical element in the development of systems for automated

Selection of Calibration Particles for Scanning Surface Inspection Systems

August 8, 1996
Author(s)
George W. Mulholland, Nelson P. Bryner, Walter S. Liggett Jr, B W. Scheer, R. K. Goodall
In response to the semiconductor industry's need for both smaller calibration particles and more accurately sized larger particles, a joint SEMATECH, National Institute of Standards and Technology, and VLSI Standards, Inc. project was initiated to

Application of Chaotic Dynamics to Stochastic Resonance.

August 7, 1996
Author(s)
Marek Franaszek, Emil Simiu
For a class of systems with a periodic signal and noise, the improvement of the signal to noise ratio (SNR) achieved by increasing the noise intensity is referred to as stochastic resonance (SR). We show that, for a class of multistable systems, a chotic
Displaying 55326 - 55350 of 74195
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