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Displaying 54626 - 54650 of 74196

Electron-Impact Total Ionization Cross Sections of CH AND C 2 H 2

January 1, 1997

Author(s)

Y -. Kim, M E. Rudd

Electronic characteristic of Ge and InGaAs radiometers ed. by Bjorn F. Andresen; Marija Strojnik Scholl

January 1, 1997

Author(s)

George P. Eppeldauer

Electronics and Electrical Engineering Laboratory::technical progress bulletin covering laboratory programs, April to June 1997, with 1997-1998 EEEL events calendar

January 1, 1997

Author(s)

J M Rohrbaugh

Electronics and Electrical Engineering Laboratory::technical progress bulletin covering laboratory programs, January to March 1997, with 1997-1998 EEEL events calendar

January 1, 1997

Author(s)

J M Rohrbaugh

Electronics and Electrical Engineering Laboratory::technical progress bulletin covering laboratory programs, July to September 1997, with 1997-1998 EEEL events calendar

January 1, 1997

Author(s)

J M Rohrbaugh

Electronics and Electrical Engineering Laboratory::technical progress bulletin covering laboratory programs, October to December 1996, with 1997-1998 EEEL events calendar

January 1, 1997

Author(s)

J M Rohrbaugh

Electronics and Electrical Engineering Laboratory::technical publication announcements covering laboratory programs, January to March 1997, with 1997-1998 EEEL events calendar

January 1, 1997

Author(s)

J M Rohrbaugh

Electronics and Electrical Engineering Laboratory::technical publication announcements covering laboratory programs, October to December 1996, with 1997-1998 EEEL events calendar

January 1, 1997

Author(s)

J M Rohrbaugh

Emergence of interaction effects in Bose-Einstein condensation

January 1, 1997

Author(s)

M J. Holland, D S. Jin, M L. Chiofalo, J Cooper

Encapsulation of 99m Tc within Fullerenes: a Novel Radionuclidic Carrier

January 1, 1997

Author(s)

Lisa R. Karam, Michael G. Mitch, Bert M. Coursey

Energy price indices and discount factors for life-cycle cost analysis - April 1997:

January 1, 1997

Author(s)

Sieglinde K Fuller

Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination

January 1, 1997

Author(s)

Z L. Wang, D van Heerden, Daniel Josell, Alexander J. Shapiro

Environmental Sensitivities of Cavity Tuned Hydrogen Masers

January 1, 1997

Author(s)

Thomas E. Parker, J E. Gray, Trudi K. Peppler

EOS Radiometric Measurement Comparisons at NEC Corporation and Mitsubishi Electric Corporation

January 1, 1997

Author(s)

James J. Butler, B. Carol Johnson

Establishing a Common Rockwell Hardness Scale Using Geometrically Calibrated Standard Diamond Indenters

January 1, 1997

Author(s)

Jun-Feng Song

Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. In this paper, we describe several intercomparisons to determine if tightly controlled indenter geometry can

Establishing a Worldwide Unified Rockwell Hardness Scale With Metrology Traceability

January 1, 1997

Author(s)

Jun-Feng Song, Samuel Low, David J. Pitchure, A Germak, S Desogus, T Polzin, H Yang, H Ishida, G Barbato

Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. It is now possible to establish standard grade Rockwell diamond indenters characterized by high geometry

Establishment of the NIST Flashing-Light Photometric Unit

January 1, 1997

Author(s)

Yoshihiro Ohno

Evaluation of an Injection Molding Process Model Using the Calculus of Imprecision to Simultaneously Specify Tolerances and Process Parameters

January 1, 1997

Author(s)

Ronald Giachetti

The strong interrelationship between part geometry, material properties, tolerances, and process parameters for injection molded parts hinders tolerance allocation and process specification. The traditional design process of first optimizing tolerances and