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NIST Authors in Bold

Displaying 54476 - 54500 of 73697

The NIST Electronic Kilogram

January 1, 1997
Author(s)
David B. Newell, K Fujii, Andrew Gillespie, P. T. Olsen, Alain Picard, Richard L. Steiner, Gerard N. Stenbakken, Edwin R. Williams

The NIST Magnetic Imaging Reference Sample

January 1, 1997
Author(s)
Paul Rice, Stephen E. Russek, J Hoinville, Michael H. Kelley
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have

The Scanning Electron Microscope

January 1, 1997
Author(s)
Michael T. Postek
The scanning electron microscope (SEM) is an important research and production tool extensively used in many phases of industry throughout the world. The popularity of the instrument results from the need to inspect and obtain information about samples
Displaying 54476 - 54500 of 73697
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