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Displaying 54251 - 54275 of 73697

Metrology for Information Technology (IT)

January 1, 1997
Author(s)
Lisa Carnahan, M M. Gray, Michael Hogan, Ted Hopp, Jeffrey Horlick, Gordon E. Lyon, Elena R. Messina
The scope of this white paper is the testing or measuring of digital information technology (IT) systems attributes or proporties; the use of digitial IT systems in testing and measuring; and the underlying mathematical, computational, and statistical

New NIST-Certified Small Scale Pitch Standard

January 1, 1997
Author(s)
James E. Potzick
The National Institute of Standards and Technology is developing a dimensional pitch standard covering the range 1 ?m to 10 mm, intended for the calibration of microscope magnification and dimensional metrology instrument scales. While NIST has long
Displaying 54251 - 54275 of 73697
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