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Wobble Normalization for Optical In Situ Measurements in Molecular Beam Epitaxy

Published

Author(s)

Kristine A. Bertness, Robert K. Hickernell, David H. Christensen
Proceedings Title
Tech. Prog., 16th Annual North American Conf. on Molecular Beam Epitaxy
Issue
34
Conference Dates
October 5-8, 1997
Conference Location
Ann Arbor, MI

Citation

Bertness, K. , Hickernell, R. and Christensen, D. (1997), Wobble Normalization for Optical In Situ Measurements in Molecular Beam Epitaxy, Tech. Prog., 16th Annual North American Conf. on Molecular Beam Epitaxy, Ann Arbor, MI, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=8081 (Accessed April 13, 2024)
Created October 4, 1997, Updated October 12, 2021