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Displaying 53826 - 53850 of 73697

AC Josephson Voltage Standard: Progress Report

April 1, 1997
Author(s)
Clark A. Hamilton, Charles J. Burroughs, Samuel Benz, Joseph R. Kinard Jr.
Progress toward a Josephson voltage standard for fast dc measurements and accurate ac waveform systhesis is described. A superconductor-normal-superconductor (SNS) junction process is used to make 5 mA critical current arrays with up to 32 768 junctions

Glass and Dimensional Metrology

April 1, 1997
Author(s)
Theodore D. Doiron
Ordinary glass, even good optical quality glass, will shrink up to 20 micrometers/meter over the first few years after its manufacture. Gages made of glass are therefore not suitable as high accuracy artifacts unless they are calibrated often. Better

High-Speed Grinding - Fundamentals and State of the Art in Europe, Japan, and the USA

April 1, 1997
Author(s)
F Klocke, E Brinksmeier, Christopher J. Evans, T Howes, I Inasaki, E Minke, H Tonshoff, J A. Webster, D Stuff
This paper describes the technological basis and the current state of the art in the field of high speed grinding. The technological fundamentals of high speed grinding are first of all presented on the basis of the kinematics of the chip-forming process

Interlaboratory verification of silicon nitride tensile creep properties

April 1, 1997
Author(s)
William E. Luecke, Sheldon M. Wiederhorn
Five laboratories tested NIST-supplied, pin-loaded, 76-mm-long tensile creep specimens at 1400 degrees C under a 150 MPa load using flag-based, laser extensometry, The laboratories reported failure time and strain and supplied the individual creep curves
Displaying 53826 - 53850 of 73697
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